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Ultra thin film deposition of nickel...
~
Balutiu, Annemarie.
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Ultra thin film deposition of nickel, cobalt and nickel-cobalt and evaluation using scanning acoustic microscopy.
紀錄類型:
書目-電子資源 : Monograph/item
正題名/作者:
Ultra thin film deposition of nickel, cobalt and nickel-cobalt and evaluation using scanning acoustic microscopy./
作者:
Balutiu, Annemarie.
面頁冊數:
94 p.
附註:
Source: Masters Abstracts International, Volume: 46-04, page: 2123.
Contained By:
Masters Abstracts International46-04.
標題:
Chemistry, Inorganic. -
電子資源:
http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=MR35024
ISBN:
9780494350249
Ultra thin film deposition of nickel, cobalt and nickel-cobalt and evaluation using scanning acoustic microscopy.
Balutiu, Annemarie.
Ultra thin film deposition of nickel, cobalt and nickel-cobalt and evaluation using scanning acoustic microscopy.
- 94 p.
Source: Masters Abstracts International, Volume: 46-04, page: 2123.
Thesis (M.Sc.)--University of Windsor (Canada), 2007.
This item must not be sold to any third party vendors.
In the last few years, ultra-thin films have been widely adopted in medical and industrial applications; especially the dielectric implants coated with porous ultra thin films used in medical field. In the present investigation, a combination of two techniques was used: a classic one for the deposition of ultra thin films (i.e., electroless deposition) and a complementary non-destructive technique (i.e., scanning acoustic microscopy) for quality evaluation of nickel cobalt ultra thin films grown on a dielectric substrate. The developed method is useful for further improvement of designing and manufacturing of the films.
ISBN: 9780494350249Subjects--Topical Terms:
517253
Chemistry, Inorganic.
Ultra thin film deposition of nickel, cobalt and nickel-cobalt and evaluation using scanning acoustic microscopy.
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In the last few years, ultra-thin films have been widely adopted in medical and industrial applications; especially the dielectric implants coated with porous ultra thin films used in medical field. In the present investigation, a combination of two techniques was used: a classic one for the deposition of ultra thin films (i.e., electroless deposition) and a complementary non-destructive technique (i.e., scanning acoustic microscopy) for quality evaluation of nickel cobalt ultra thin films grown on a dielectric substrate. The developed method is useful for further improvement of designing and manufacturing of the films.
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In order to evaluate interface conditions with maximum sensitivity, high frequency (i.e., 600 MHz and 1 GHz) was employed. A highly focused ultrasonic beam emitted from a high numerical aperture enhanced contrast in the image. Therefore, the image showed minute details (i.e., porosity, micro-cracks, delaminations, detect poor adhesion at the interface), that other conventional microscopes have difficulty visualizing.
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