東華大學圖書館 |

語系: 繁體中文

說明(常見問題)

回圖書館首頁

手機版館藏查詢

登入

回首頁

切換: 標籤 | MARC模式 | ISBD

Transmission electron microscopy = d...

Carter, C. Barry.

FindBook

Google Book

Amazon

博客來

Transmission electron microscopy = diffraction, imaging, and spectrometry /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Transmission electron microscopy/ edited by C. Barry Carter, David B. Williams.
其他題名:	diffraction, imaging, and spectrometry /
其他作者:	Carter, C. Barry.
出版者:	Cham :Springer International Publishing : : 2016.,
面頁冊數:	xxxiii, 518 p. :ill., digital ;24 cm.
內容註:	Foreword by Sir John Meurig Thomas -- 1. Electron Sources -- 2. In Situ and Operando -- 3. Electron Diffraction and Phase Identification -- 4. Convergent-Beam Diffraction: Symmetry and Large-Angle Patterns -- 5. Electron crystallography, charge-density mapping and nanodiffraction -- 6. Digital Micrograph -- 7. Electron waves, interference & coherence -- 8. Electron Holography -- 9. Focal-Series Reconstruction -- 10. Direct Methods For Image Interpretation -- 11. Imaging in the STEM -- 12. Electron Tomography -- 13. Energy-Filtered Transmission Electron Microscopy -- 14. Calculation of Electron Energy-Loss Spectra -- 15. Electron Diffraction & X-Ray Excitation -- 16. X-Ray and Electron Energy-Loss Spectral Imaging -- 17. Practical Aspects and Advanced Applications of XEDS.
Contained By:	Springer eBooks
標題:	Transmission electron microscopy. -
電子資源:	http://dx.doi.org/10.1007/978-3-319-26651-0
ISBN:	9783319266510

Transmission electron microscopy = diffraction, imaging, and spectrometry /
Transmission electron microscopydiffraction, imaging, and spectrometry /[electronic resource] :edited by C. Barry Carter, David B. Williams. - Cham :Springer International Publishing :2016. - xxxiii, 518 p. :ill., digital ;24 cm.

Foreword by Sir John Meurig Thomas -- 1. Electron Sources -- 2. In Situ and Operando -- 3. Electron Diffraction and Phase Identification -- 4. Convergent-Beam Diffraction: Symmetry and Large-Angle Patterns -- 5. Electron crystallography, charge-density mapping and nanodiffraction -- 6. Digital Micrograph -- 7. Electron waves, interference & coherence -- 8. Electron Holography -- 9. Focal-Series Reconstruction -- 10. Direct Methods For Image Interpretation -- 11. Imaging in the STEM -- 12. Electron Tomography -- 13. Energy-Filtered Transmission Electron Microscopy -- 14. Calculation of Electron Energy-Loss Spectra -- 15. Electron Diffraction & X-Ray Excitation -- 16. X-Ray and Electron Energy-Loss Spectral Imaging -- 17. Practical Aspects and Advanced Applications of XEDS.

ISBN: 9783319266510

Standard No.: 10.1007/978-3-319-26651-0doiSubjects--Topical Terms:

567074
Transmission electron microscopy.

LC Class. No.: QH212.T7

Dewey Class. No.: 502.825

Transmission electron microscopy = diffraction, imaging, and spectrometry /
LDR:01758nmm a2200301 a 4500 001 2047701
003 DE-He213
005 20160824160859.0
006 m d
007 cr nn 008maaau
008 170319s2016 gw s 0 eng d
020 $a 9783319266510 $q (electronic bk.)
020 $a 9783319266497 $q (paper)
024 7 $a 10.1007/978-3-319-26651-0 $2 doi
035 $a 978-3-319-26651-0
040 $a GP $c GP
041 0 $a eng
050 4 $a QH212.T7
072 7 $a TGMT $2 bicssc
072 7 $a TEC021000 $2 bisacsh
082 0 4 $a 502.825 $2 23
090 $a QH212.T7 $b T772 2016
245 0 0 $a Transmission electron microscopy $h [electronic resource] : $b diffraction, imaging, and spectrometry / $c edited by C. Barry Carter, David B. Williams.
260 $a Cham : $b Springer International Publishing : $b Imprint: Springer, $c 2016.
300 $a xxxiii, 518 p. : $b ill., digital ; $c 24 cm.
505 0 $a Foreword by Sir John Meurig Thomas -- 1. Electron Sources -- 2. In Situ and Operando -- 3. Electron Diffraction and Phase Identification -- 4. Convergent-Beam Diffraction: Symmetry and Large-Angle Patterns -- 5. Electron crystallography, charge-density mapping and nanodiffraction -- 6. Digital Micrograph -- 7. Electron waves, interference & coherence -- 8. Electron Holography -- 9. Focal-Series Reconstruction -- 10. Direct Methods For Image Interpretation -- 11. Imaging in the STEM -- 12. Electron Tomography -- 13. Energy-Filtered Transmission Electron Microscopy -- 14. Calculation of Electron Energy-Loss Spectra -- 15. Electron Diffraction & X-Ray Excitation -- 16. X-Ray and Electron Energy-Loss Spectral Imaging -- 17. Practical Aspects and Advanced Applications of XEDS.
650 0 $a Transmission electron microscopy. $3 567074
650 1 4 $a Materials Science. $3 890867
650 2 4 $a Characterization and Evaluation of Materials. $3 890988
650 2 4 $a Nanoscale Science and Technology. $3 1244861
650 2 4 $a Spectroscopy/Spectrometry. $3 1084899
650 2 4 $a Solid State Physics. $3 1066374
650 2 4 $a Spectroscopy and Microscopy. $3 1066375
650 2 4 $a Continuum Mechanics and Mechanics of Materials. $3 890989
700 1 $a Carter, C. Barry. $3 723708
700 1 $a Williams, David B. $3 2209840
710 2 $a SpringerLink (Online service) $3 836513
773 0 $t Springer eBooks
856 4 0 $u http://dx.doi.org/10.1007/978-3-319-26651-0
950 $a Chemistry and Materials Science (Springer-11644)