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Metrology and physical mechanisms in...

Celano, Umberto.

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Metrology and physical mechanisms in new generation ionic devices

Record Type:	Electronic resources : Monograph/item
Title/Author:	Metrology and physical mechanisms in new generation ionic devices/ by Umberto Celano.
Author:	Celano, Umberto.
Published:	Cham :Springer International Publishing : : 2016.,
Description:	xxiv, 175 p. :ill. (some col.), digital ;24 cm.
[NT 15003449]:	Introduction -- Filamentary-Based Resistive Switching -- Nanoscaled Electrical Characterization -- Conductive Filaments: Formation, Observation and Manipulation -- Three-Dimensional Filament Observation -- Reliability Threats in CBRAM -- Conclusions and Outlook.
Contained By:	Springer eBooks
Subject:	Thin films. -
Online resource:	http://dx.doi.org/10.1007/978-3-319-39531-9
ISBN:	9783319395319

Metrology and physical mechanisms in new generation ionic devices
Celano, Umberto.

Metrology and physical mechanisms in new generation ionic devices[electronic resource] /by Umberto Celano. - Cham :Springer International Publishing :2016. - xxiv, 175 p. :ill. (some col.), digital ;24 cm. - Springer theses,2190-5053. - Springer theses..

Introduction -- Filamentary-Based Resistive Switching -- Nanoscaled Electrical Characterization -- Conductive Filaments: Formation, Observation and Manipulation -- Three-Dimensional Filament Observation -- Reliability Threats in CBRAM -- Conclusions and Outlook.

The thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed.

ISBN: 9783319395319

Standard No.: 10.1007/978-3-319-39531-9doiSubjects--Topical Terms:

626403
Thin films.

LC Class. No.: QC176.83

Dewey Class. No.: 621.38152

Metrology and physical mechanisms in new generation ionic devices
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245 1 0 $a Metrology and physical mechanisms in new generation ionic devices $h [electronic resource] / $c by Umberto Celano.
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520 $a The thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed.
650 0 $a Thin films. $3 626403
650 0 $a Electronic apparatus and appliances. $3 526237
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