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Advanced transmission electron micro...

Deepak, Francis Leonard.

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Advanced transmission electron microscopy = applications to nanomaterials /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Advanced transmission electron microscopy/ edited by Francis Leonard Deepak, Alvaro Mayoral, Raul Arenal.
其他題名:	applications to nanomaterials /
其他作者:	Deepak, Francis Leonard.
出版者:	Cham :Springer International Publishing : : 2015.,
面頁冊數:	xii, 272 p. :ill. (some col.), digital ;24 cm.
內容註:	Preface -- Introduction to TEM, HRTEM and aberration corrected microscopy -- Electron diffraction and crystal orientation phase mapping under scanning transmission electron microscopy -- Advanced Electron Microscopy in the Study of Multi metallic Nanoparticles -- Zeolites and Ordered Mesoporous materials under the electron microscope -- Local TEM spectroscopic studies on carbon- and boron nitride-based nanomaterials -- 3D-nanometric analyses via electron tomography: application to nanomaterials -- In situ TEM of carbon nanotubes -- Physical characterization of nanomaterials in dispersion by transmission electron microscopy in a regulatory framework.
Contained By:	Springer eBooks
標題:	Transmission electron microscopy. -
電子資源:	http://dx.doi.org/10.1007/978-3-319-15177-9
ISBN:	9783319151779 (electronic bk.)

Advanced transmission electron microscopy = applications to nanomaterials /
Advanced transmission electron microscopyapplications to nanomaterials /[electronic resource] :edited by Francis Leonard Deepak, Alvaro Mayoral, Raul Arenal. - Cham :Springer International Publishing :2015. - xii, 272 p. :ill. (some col.), digital ;24 cm.

Preface -- Introduction to TEM, HRTEM and aberration corrected microscopy -- Electron diffraction and crystal orientation phase mapping under scanning transmission electron microscopy -- Advanced Electron Microscopy in the Study of Multi metallic Nanoparticles -- Zeolites and Ordered Mesoporous materials under the electron microscope -- Local TEM spectroscopic studies on carbon- and boron nitride-based nanomaterials -- 3D-nanometric analyses via electron tomography: application to nanomaterials -- In situ TEM of carbon nanotubes -- Physical characterization of nanomaterials in dispersion by transmission electron microscopy in a regulatory framework.

This book highlights the current understanding of materials in the context of new and continuously emerging techniques in the field of electron microscopy. The authors present applications of electron microscopic techniques in characterizing various well-known & new nanomaterials. The applications described include both inorganic nanomaterials as well as organic nanomaterials.

ISBN: 9783319151779 (electronic bk.)

Standard No.: 10.1007/978-3-319-15177-9doiSubjects--Topical Terms:

567074
Transmission electron microscopy.

LC Class. No.: QH212.T7

Dewey Class. No.: 502.825

Advanced transmission electron microscopy = applications to nanomaterials /
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