X-ray line profile analysis in mater...
Gubicza, Jeno, (1969-)

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  • X-ray line profile analysis in materials science /
  • 紀錄類型: 書目-電子資源 : Monograph/item
    正題名/作者: X-ray line profile analysis in materials science // Jeno Gubicza.
    作者: Gubicza, Jeno,
    面頁冊數: PDFs (343 pages)
    內容註: Fundamentals of kinematical X-ray scattering theory -- Crystallite size broadening of diffraction line profiles -- Strain broadening of X-ray diffraction peaks -- Line profiles caused by planar faults -- Influence of chemical heterogeneities on line profiles -- Evaluation methods of line profiles -- Peak profile evaluation for thin films -- X-ray line profile analysis for single crystals -- Practical applications of X-ray line profile analysis.
    標題: X-ray crystallography. -
    電子資源: http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-4666-5852-3
    ISBN: 9781466658530
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W9269453 電子資源 11.線上閱覽_V 電子書 EB QD945 .G83 2014e 一般使用(Normal) 在架 0
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