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Surface science tools for nanomateri...

Kumar, Challa S. S. R.

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Surface science tools for nanomaterials characterization

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Surface science tools for nanomaterials characterization/ edited by Challa S. S. R. Kumar.
其他作者:	Kumar, Challa S. S. R.
出版者:	Berlin, Heidelberg :Springer Berlin Heidelberg : : 2015.,
面頁冊數:	x, 652 p. :ill. (some col.), digital ;24 cm.
內容註:	Higher Resolution Scanning Probe Methods for Magnetic Imaging -- The Synchrotron Based VUV Resonant Photoemission for Characterisation of Nanomaterials -- SPM for Characterization of PbSe Nanocrystals.-Scanning Probe Microscopy for Nanolithography -- Kelvin Probe Force Microscopy.-Synchrotron Radiation X-ray Photoelectron Spectroscopy -- Scanning Electrochemical Potential Microscopy (SECPM) and Electrochemical STM (EC-STM) -- Band Bending at Metal-Semiconductor and Metal-Ferroelectric Interfaces Investigated by Photoelectron Spectroscopy -- Magnetic Force Microscopy -- High Resolution STM Imaging.-Numerical Simulations on Nanotips for FIM and FEM .-ARPES on Organic Semiconductor Single Crystals Crystalline Films -- FIM-Characterized Tips for SPM -- Scanning Conductive Torsion Mode Microscopy -- Scanning Probe Acceleration Microscopy (SPAM) -- Combining Micromanipulation, Kerr Magnetometry and Magnetic Force Microscopy for Characterization of Magnetic Nanostructures -- Field Ion Microscopy (FIM) -- Non-Contact Atomic Force Microscopy for Characterization of Nanostructures and Beyond.
Contained By:	Springer eBooks
標題:	Nanochemistry. -
電子資源:	http://dx.doi.org/10.1007/978-3-662-44551-8
ISBN:	9783662445518 (electronic bk.)

Surface science tools for nanomaterials characterization
Surface science tools for nanomaterials characterization[electronic resource] /edited by Challa S. S. R. Kumar. - Berlin, Heidelberg :Springer Berlin Heidelberg :2015. - x, 652 p. :ill. (some col.), digital ;24 cm.

Higher Resolution Scanning Probe Methods for Magnetic Imaging -- The Synchrotron Based VUV Resonant Photoemission for Characterisation of Nanomaterials -- SPM for Characterization of PbSe Nanocrystals.-Scanning Probe Microscopy for Nanolithography -- Kelvin Probe Force Microscopy.-Synchrotron Radiation X-ray Photoelectron Spectroscopy -- Scanning Electrochemical Potential Microscopy (SECPM) and Electrochemical STM (EC-STM) -- Band Bending at Metal-Semiconductor and Metal-Ferroelectric Interfaces Investigated by Photoelectron Spectroscopy -- Magnetic Force Microscopy -- High Resolution STM Imaging.-Numerical Simulations on Nanotips for FIM and FEM .-ARPES on Organic Semiconductor Single Crystals Crystalline Films -- FIM-Characterized Tips for SPM -- Scanning Conductive Torsion Mode Microscopy -- Scanning Probe Acceleration Microscopy (SPAM) -- Combining Micromanipulation, Kerr Magnetometry and Magnetic Force Microscopy for Characterization of Magnetic Nanostructures -- Field Ion Microscopy (FIM) -- Non-Contact Atomic Force Microscopy for Characterization of Nanostructures and Beyond.

Fourth volume of a 40volume series on nano science and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Surface Science Tools for Nanomaterials Characterization. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.

ISBN: 9783662445518 (electronic bk.)

Standard No.: 10.1007/978-3-662-44551-8doiSubjects--Topical Terms:

813421
Nanochemistry.

LC Class. No.: QC176.8.N35

Dewey Class. No.: 620.5

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505 0 $a Higher Resolution Scanning Probe Methods for Magnetic Imaging -- The Synchrotron Based VUV Resonant Photoemission for Characterisation of Nanomaterials -- SPM for Characterization of PbSe Nanocrystals.-Scanning Probe Microscopy for Nanolithography -- Kelvin Probe Force Microscopy.-Synchrotron Radiation X-ray Photoelectron Spectroscopy -- Scanning Electrochemical Potential Microscopy (SECPM) and Electrochemical STM (EC-STM) -- Band Bending at Metal-Semiconductor and Metal-Ferroelectric Interfaces Investigated by Photoelectron Spectroscopy -- Magnetic Force Microscopy -- High Resolution STM Imaging.-Numerical Simulations on Nanotips for FIM and FEM .-ARPES on Organic Semiconductor Single Crystals Crystalline Films -- FIM-Characterized Tips for SPM -- Scanning Conductive Torsion Mode Microscopy -- Scanning Probe Acceleration Microscopy (SPAM) -- Combining Micromanipulation, Kerr Magnetometry and Magnetic Force Microscopy for Characterization of Magnetic Nanostructures -- Field Ion Microscopy (FIM) -- Non-Contact Atomic Force Microscopy for Characterization of Nanostructures and Beyond.
520 $a Fourth volume of a 40volume series on nano science and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Surface Science Tools for Nanomaterials Characterization. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.
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