Debug automation from pre-silicon to...
Fey, Gorschwin.

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  • Debug automation from pre-silicon to post-silicon
  • 紀錄類型: 書目-電子資源 : Monograph/item
    正題名/作者: Debug automation from pre-silicon to post-silicon/ by Mehdi Dehbashi, Gorschwin Fey.
    作者: Dehbashi, Mehdi.
    其他作者: Fey, Gorschwin.
    出版者: Cham :Springer International Publishing : : 2015.,
    面頁冊數: xiv, 171 p. :ill. (some col.), digital ;24 cm.
    內容註: Introduction -- Preliminaries -- Part I Debug of Design Bugs -- Automated Debugging for Logic Bugs -- Automated Debugging from Pre-Silicon to Post-Silicon -- Automated Debugging for Synchronization Bugs -- Part II Debug of Delay Faults -- Analyzing Timing Variations -- Automated Debugging for Timing Variations -- Efficient Automated Speedpath Debugging -- Part III Debug of Transactions -- Online Debug for NoC-Based Multiprocessor SoCs -- Summary and Outlook.
    Contained By: Springer eBooks
    標題: Integrated circuits - Very large scale integration -
    電子資源: http://dx.doi.org/10.1007/978-3-319-09309-3
    ISBN: 9783319093093 (electronic bk.)
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