語系:
繁體中文
English
說明(常見問題)
回圖書館首頁
手機版館藏查詢
登入
回首頁
切換:
標籤
|
MARC模式
|
ISBD
Compact models and performance inves...
~
Dhiman, Rohit.
FindBook
Google Book
Amazon
博客來
Compact models and performance investigations for subthreshold interconnects
紀錄類型:
書目-電子資源 : Monograph/item
正題名/作者:
Compact models and performance investigations for subthreshold interconnects/ by Rohit Dhiman, Rajeevan Chandel.
作者:
Dhiman, Rohit.
其他作者:
Chandel, Rajeevan.
出版者:
New Delhi :Springer India : : 2015.,
面頁冊數:
xiii, 113 p. :ill., digital ;24 cm.
內容註:
Introduction -- Design Challenges in Sub-threshold Interconnect Circuits -- Sub-threshold Interconnect Circuit Design -- Characterization of Dynamic Crosstalk Effect In Sub-threshold Interconnects -- Sub-threshold Interconnect Noise Analysis -- Variability in Sub-threshold Interconnects.
Contained By:
Springer eBooks
標題:
Interconnects (Integrated circuit technology) - Design. -
電子資源:
http://dx.doi.org/10.1007/978-81-322-2132-6
ISBN:
9788132221326 (electronic bk.)
Compact models and performance investigations for subthreshold interconnects
Dhiman, Rohit.
Compact models and performance investigations for subthreshold interconnects
[electronic resource] /by Rohit Dhiman, Rajeevan Chandel. - New Delhi :Springer India :2015. - xiii, 113 p. :ill., digital ;24 cm. - Energy systems in electrical engineering,2199-8582. - Energy systems in electrical engineering..
Introduction -- Design Challenges in Sub-threshold Interconnect Circuits -- Sub-threshold Interconnect Circuit Design -- Characterization of Dynamic Crosstalk Effect In Sub-threshold Interconnects -- Sub-threshold Interconnect Noise Analysis -- Variability in Sub-threshold Interconnects.
Compact Models and Performance Investigations for Sub-threshold Interconnects provides a detailed analysis of issues related to sub-threshold interconnect performance from the perspective of analytical approach and design techniques. Particular emphasis is laid on the performance analysis of coupling noise and variability issues in sub-threshold domain to develop efficient compact models. The proposed analytical approach gives physical insight of the parameters affecting the transient behavior of coupled interconnects. Remedial design techniques are also suggested to mitigate the effect of coupling noise. The effects of wire width, spacing between the wires, wire length are thoroughly investigated. In addition, the effect of parameters like driver strength on peak coupling noise has also been analyzed. Process, voltage and temperature variations are prominent factors affecting sub-threshold design and have also been investigated. The process variability analysis has been carried out using parametric analysis, process corner analysis and Monte Carlo technique. The book also provides a qualitative summary of the work reported in the literature by various researchers in the design of digital sub-threshold circuits. This book should be of interest for researchers and graduate students with deeper insights into sub-threshold interconnect models in particular. In this sense, this book will best fit as a text book and/or a reference book for students who are initiated in the area of research and advanced courses in nanotechnology, interconnect design and modeling.
ISBN: 9788132221326 (electronic bk.)
Standard No.: 10.1007/978-81-322-2132-6doiSubjects--Topical Terms:
2131821
Interconnects (Integrated circuit technology)
--Design.
LC Class. No.: TK7874.53
Dewey Class. No.: 621.3815
Compact models and performance investigations for subthreshold interconnects
LDR
:02904nmm a2200325 a 4500
001
1993520
003
DE-He213
005
20150703153927.0
006
m d
007
cr nn 008maaau
008
151019s2015 ii s 0 eng d
020
$a
9788132221326 (electronic bk.)
020
$a
9788132221319 (paper)
024
7
$a
10.1007/978-81-322-2132-6
$2
doi
035
$a
978-81-322-2132-6
040
$a
GP
$c
GP
041
0
$a
eng
050
4
$a
TK7874.53
072
7
$a
TJFC
$2
bicssc
072
7
$a
TEC008010
$2
bisacsh
082
0 4
$a
621.3815
$2
23
090
$a
TK7874.53
$b
.D534 2015
100
1
$a
Dhiman, Rohit.
$3
2131818
245
1 0
$a
Compact models and performance investigations for subthreshold interconnects
$h
[electronic resource] /
$c
by Rohit Dhiman, Rajeevan Chandel.
260
$a
New Delhi :
$b
Springer India :
$b
Imprint: Springer,
$c
2015.
300
$a
xiii, 113 p. :
$b
ill., digital ;
$c
24 cm.
490
1
$a
Energy systems in electrical engineering,
$x
2199-8582
505
0
$a
Introduction -- Design Challenges in Sub-threshold Interconnect Circuits -- Sub-threshold Interconnect Circuit Design -- Characterization of Dynamic Crosstalk Effect In Sub-threshold Interconnects -- Sub-threshold Interconnect Noise Analysis -- Variability in Sub-threshold Interconnects.
520
$a
Compact Models and Performance Investigations for Sub-threshold Interconnects provides a detailed analysis of issues related to sub-threshold interconnect performance from the perspective of analytical approach and design techniques. Particular emphasis is laid on the performance analysis of coupling noise and variability issues in sub-threshold domain to develop efficient compact models. The proposed analytical approach gives physical insight of the parameters affecting the transient behavior of coupled interconnects. Remedial design techniques are also suggested to mitigate the effect of coupling noise. The effects of wire width, spacing between the wires, wire length are thoroughly investigated. In addition, the effect of parameters like driver strength on peak coupling noise has also been analyzed. Process, voltage and temperature variations are prominent factors affecting sub-threshold design and have also been investigated. The process variability analysis has been carried out using parametric analysis, process corner analysis and Monte Carlo technique. The book also provides a qualitative summary of the work reported in the literature by various researchers in the design of digital sub-threshold circuits. This book should be of interest for researchers and graduate students with deeper insights into sub-threshold interconnect models in particular. In this sense, this book will best fit as a text book and/or a reference book for students who are initiated in the area of research and advanced courses in nanotechnology, interconnect design and modeling.
650
0
$a
Interconnects (Integrated circuit technology)
$x
Design.
$3
2131821
650
0
$a
Integrated circuits
$x
Very large scale integration
$x
Design.
$3
629093
650
1 4
$a
Engineering.
$3
586835
650
2 4
$a
Circuits and Systems.
$3
896527
650
2 4
$a
Electronics and Microelectronics, Instrumentation.
$3
893838
650
2 4
$a
Power Electronics, Electrical Machines and Networks.
$3
1001796
650
2 4
$a
Signal, Image and Speech Processing.
$3
891073
700
1
$a
Chandel, Rajeevan.
$3
2131819
710
2
$a
SpringerLink (Online service)
$3
836513
773
0
$t
Springer eBooks
830
0
$a
Energy systems in electrical engineering.
$3
2131820
856
4 0
$u
http://dx.doi.org/10.1007/978-81-322-2132-6
950
$a
Energy (Springer-40367)
筆 0 讀者評論
館藏地:
全部
電子資源
出版年:
卷號:
館藏
1 筆 • 頁數 1 •
1
條碼號
典藏地名稱
館藏流通類別
資料類型
索書號
使用類型
借閱狀態
預約狀態
備註欄
附件
W9266227
電子資源
11.線上閱覽_V
電子書
EB TK7874.53
一般使用(Normal)
在架
0
1 筆 • 頁數 1 •
1
多媒體
評論
新增評論
分享你的心得
Export
取書館
處理中
...
變更密碼
登入