An atom trap trace analysis (ATTA) s...
Yoon, Tae Hyun.

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  • An atom trap trace analysis (ATTA) system for measuring ultra-low contamination by krypton in xenon dark matter detectors.
  • Record Type: Language materials, printed : Monograph/item
    Title/Author: An atom trap trace analysis (ATTA) system for measuring ultra-low contamination by krypton in xenon dark matter detectors./
    Author: Yoon, Tae Hyun.
    Description: 142 p.
    Notes: Source: Dissertation Abstracts International, Volume: 75-02(E), Section: B.
    Contained By: Dissertation Abstracts International75-02B(E).
    Subject: Physics, Atomic. -
    Online resource: http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3600541
    ISBN: 9781303506680
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