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New approaches to image processing b...
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Zalevsky, Zeev.
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New approaches to image processing based failure analysis of nano-scale ULSI devices
Record Type:
Electronic resources : Monograph/item
Title/Author:
New approaches to image processing based failure analysis of nano-scale ULSI devices/ Zeev Zalevsky, Pavel Livshits, Eran Gur.
Author:
Zalevsky, Zeev.
other author:
Livshits, Pavel.
Published:
Amsterdam :Elsevier/William Andrew, : 2014.,
Description:
101 p. :ill. ;23 cm.
Subject:
Integrated circuits - Ultra large scale integration -
Online resource:
http://www.sciencedirect.com/science/book/9780323241434
ISBN:
9780323241434 (electronic bk.)
New approaches to image processing based failure analysis of nano-scale ULSI devices
Zalevsky, Zeev.
New approaches to image processing based failure analysis of nano-scale ULSI devices
[electronic resource] /Zeev Zalevsky, Pavel Livshits, Eran Gur. - Amsterdam :Elsevier/William Andrew,2014. - 101 p. :ill. ;23 cm. - Micro & nano technologies series. - Micro & nano technologies..
Includes bibliographical references.
New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures. Engineers and scientists face the pressing problem in ULSI development and quality assurance: microscopy methods can't keep pace with the continuous shrinking of feature size in microelectronics. Nanometer scale sizes are below the resolution of light, and imaging these features is nearly impossible even with electron microscopes, due to image noise.
ISBN: 9780323241434 (electronic bk.)Subjects--Topical Terms:
2045993
Integrated circuits
--Ultra large scale integration
LC Class. No.: TK7874.76 / .Z384 2014
Dewey Class. No.: 621.4
New approaches to image processing based failure analysis of nano-scale ULSI devices
LDR
:01393cmm a2200229 a 4500
001
1952111
005
20140701165341.0
008
150102s2014 ne a sb 000 0 eng d
020
$a
9780323241434 (electronic bk.)
020
$a
9780323241434
035
$a
(OCoLC)875166733
035
$a
14000370
040
$a
IND
$b
eng
$e
rda
$c
IND
$d
BTCTA
$d
YDXCP
$d
UKMGB
$d
CDX
$d
OCLCO
041
0
$a
eng
050
4
$a
TK7874.76
$b
.Z384 2014
082
0 4
$a
621.4
$2
23
100
1
$a
Zalevsky, Zeev.
$3
579717
245
1 0
$a
New approaches to image processing based failure analysis of nano-scale ULSI devices
$h
[electronic resource] /
$c
Zeev Zalevsky, Pavel Livshits, Eran Gur.
260
$a
Amsterdam :
$b
Elsevier/William Andrew,
$c
2014.
300
$a
101 p. :
$b
ill. ;
$c
23 cm.
490
1
$a
Micro & nano technologies series
504
$a
Includes bibliographical references.
520
$a
New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures. Engineers and scientists face the pressing problem in ULSI development and quality assurance: microscopy methods can't keep pace with the continuous shrinking of feature size in microelectronics. Nanometer scale sizes are below the resolution of light, and imaging these features is nearly impossible even with electron microscopes, due to image noise.
650
0
$a
Integrated circuits
$x
Ultra large scale integration
$x
Testing.
$3
2045993
650
0
$a
Nanoelectronics.
$3
898422
650
0
$a
Microelectronics.
$3
649832
700
1
$a
Livshits, Pavel.
$3
2045991
700
1
$a
Gur, Eran.
$3
2045992
830
0
$a
Micro & nano technologies.
$3
1068665
856
4 0
$u
http://www.sciencedirect.com/science/book/9780323241434
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W9246456
電子資源
11.線上閱覽_V
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EB TK7874.76 .Z384 2014
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