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Frontiers in optical methods : = nan...
~
Shudo, Ken-ichi.
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Frontiers in optical methods : = nano-characterization and coherent control /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
Frontiers in optical methods :/ Ken-ichi Shudo, Ikufumui Katayama, Shin-ya Ohno, editors.
其他題名:
nano-characterization and coherent control /
其他作者:
Shudo, Ken-ichi.
出版者:
Berlin ;Springer, : c2014.,
面頁冊數:
xii, 228 p. :ill. (some col.) ;24 cm.
標題:
Laser spectroscopy. -
ISBN:
9783642405938 (hbk.) :
ISSN:
03424111
Frontiers in optical methods : = nano-characterization and coherent control /
Frontiers in optical methods :
nano-characterization and coherent control /Ken-ichi Shudo, Ikufumui Katayama, Shin-ya Ohno, editors. - Berlin ;Springer,c2014. - xii, 228 p. :ill. (some col.) ;24 cm. - Springer series in optical sciences,1800342-4111 ;.
Includes bibliographical references and index.
Ultra-fast response of ultra-thin materials on solid surfaces /Ken-ichi Shudo --
This collection of reviews by leading Japanese researchers covers topics like ultrafast optical responses, terahertz and phonon studies, super-sensitive surface and high-pressure spectroscopy, combination of visible and x-ray photonics. Several related areas at the cutting edge of measurement technology and materials science are included. This book is partly based on well-cited review articles in the Japanese language in special volumes of the Journal of the Vacuum Society of Japan.
ISBN: 9783642405938 (hbk.) :EUR99.99
ISSN: 03424111
LCCN: 2013953268Subjects--Topical Terms:
592669
Laser spectroscopy.
LC Class. No.: QC451.6 / .F76 2014
Dewey Class. No.: 535.84
Frontiers in optical methods : = nano-characterization and coherent control /
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Ultra-fast response of ultra-thin materials on solid surfaces /
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Ken-ichi Shudo --
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Reflectance specroscopy: real-time analysis of initial oxidation process on Si(001) by means of surface differential reflectance spectroscopy and reflectance difference spectroscopy /
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Shin-ya Ohno, Ken-ichi Shudo and Masatoshi Tanaka --
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Development of in-vacuum microscope under high pressure and its applications /
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Takao Nanba --
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Infrared and terahertz synchrotron radiation : optics and applications /
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Shin-ichi Kimura --
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Ultrafast and coherent measurement: time-resolved x-ray diffraction studies of coherent lattice dynamics using synchrotron radiation /
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Yoshihito Tanaka --
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Coherent phonon dynamics in carbon nanotubes /
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Keiko Kato, Katsuya Oguri and Masahiro Kitajima --
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Generation and observation of GHz-THz acoustic waves in thin films and microstructures using optical methods /
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Osamu Matsuda and Oliver B. Wright --
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State-of-the-art of terahertz science and technology /
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Masayoshi Tonouchi --
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Broadband terahertz spectroscopy of thin films /
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Ikufumui Katayama and Masaaki Ashida --
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THz-technology: terahertz light source based on synchrotron radiation /
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Masahiro Katoh --
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Single photon counting and passive microscopy of terahertz radiation /
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Kenji Ikushima --
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Material evaluation with optical measurement systems : focusing on terahertz spectroscopy /
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Keiko Kitagishi.
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This collection of reviews by leading Japanese researchers covers topics like ultrafast optical responses, terahertz and phonon studies, super-sensitive surface and high-pressure spectroscopy, combination of visible and x-ray photonics. Several related areas at the cutting edge of measurement technology and materials science are included. This book is partly based on well-cited review articles in the Japanese language in special volumes of the Journal of the Vacuum Society of Japan.
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Reflectance spectroscopy.
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壽豐校區(SF Campus)
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1 (2014/08/27)
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