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Three essays on aspects of patent-re...

Lee, Yender.

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Three essays on aspects of patent-related information as measures of revealed technological capabilities.

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Three essays on aspects of patent-related information as measures of revealed technological capabilities./
作者:	Lee, Yender.
面頁冊數:	174 p.
附註:	Source: Dissertation Abstracts International, Volume: 64-04, Section: A, page: 1329.
Contained By:	Dissertation Abstracts International64-04A.
標題:	Business Administration, Management. -
電子資源:	http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=NQ78712
ISBN:	0612787125

Three essays on aspects of patent-related information as measures of revealed technological capabilities.
Lee, Yender.

Three essays on aspects of patent-related information as measures of revealed technological capabilities. - 174 p.

Source: Dissertation Abstracts International, Volume: 64-04, Section: A, page: 1329.

Thesis (Ph.D.)--McGill University (Canada), 2002.

This dissertation consists of three papers on the theme of technological capabilities. Patent information can be viewed as indicators of inventive activities emanating from a certain underlying technological capability. Cumulative patents may, therefore, be considered as the r&barbelow;evealed manifestations of those t&barbelow;echnological c&barbelow;apabilities (hereafter abbreviated as RTC) Patent databases have stored a wealth of publicly-held and verified knowledge. Each of the papers in this thesis takes-up the challenge of examining some particular aspects of RTC based on patents; and will advance our knowledge of the subject modestly in a different direction, by taking advantage of invaluable competitive information contained in patent databases. In the sense of data-mining into knowledge, we formulate and introduce a series of concepts, measurements and a methodology under the title of " patent calculation" in the first paper to mine this invaluable information. We apply this methodology, with multiple indicators, to detect the existence of technological capabilities and examine it in relation to the pattern of global collaboration in patented inventions. In the second paper we study the over time, patterns of technological capabilities in a number of countries in relation to their market and industrial structure. In the third paper we search for' potential patterns of selective concentration and specialization in the patent-intensive industries of newly industrializing countries by using the index of revealed technological advantage (RTA), which has been used as the conventional indicator in advanced countries since 1960s in technology-oriented studies. We also examine if the inherent complexities of this measure impacts the remits. In summary, we develop concepts, measures and tools, in the three essays, to take advantage of patent information to characterize the patterns of revealed technological capabilities and its variations in relation to collaboration, industrial structure, concentration and specialization. Individuals and companies should make use of this invaluable competitive knowledge in their search for technological frontiers.

ISBN: 0612787125Subjects--Topical Terms:

626628
Business Administration, Management.

Three essays on aspects of patent-related information as measures of revealed technological capabilities.
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