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Finite element analysis of moisture ...

Ghosh, Santanu.

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Finite element analysis of moisture and thermal induced stress in flip chip packages.

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Finite element analysis of moisture and thermal induced stress in flip chip packages./
作者:	Ghosh, Santanu.
面頁冊數:	67 p.
附註:	Source: Masters Abstracts International, Volume: 44-05, page: 2430.
Contained By:	Masters Abstracts International44-05.
標題:	Engineering, Mechanical. -
電子資源:	http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=1433789
ISBN:	9780542610547

Finite element analysis of moisture and thermal induced stress in flip chip packages.
Ghosh, Santanu.

Finite element analysis of moisture and thermal induced stress in flip chip packages. - 67 p.

Source: Masters Abstracts International, Volume: 44-05, page: 2430.

Thesis (M.S.)--The University of Texas at Arlington, 2006.

The process of moisture absorption and subsequent hygroswelling stress development is a cause of concern in the IC packaging industry. Also thermal stresses developed during the lead free reflow process with a high peak temperature (&sim;250°C) add to the problem. In Flip Chip packages, the related effects are high shear stresses at the multilayer interfaces and normal stresses in solder balls. This can lead to phenomenon like delamination at the interfaces and UBM opening. In this work we have made an attempt to simulate the moisture absorption process, subsequent hygroswelling stress development, and thermal stress generated during reflow using established FEA techniques. A generic FC package is used as a test vehicle and the analysis is done for two different underfill materials. Also comparison is made with published results for two different test cases.

ISBN: 9780542610547Subjects--Topical Terms:

783786
Engineering, Mechanical.

Finite element analysis of moisture and thermal induced stress in flip chip packages.
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520 $a The process of moisture absorption and subsequent hygroswelling stress development is a cause of concern in the IC packaging industry. Also thermal stresses developed during the lead free reflow process with a high peak temperature (&sim;250°C) add to the problem. In Flip Chip packages, the related effects are high shear stresses at the multilayer interfaces and normal stresses in solder balls. This can lead to phenomenon like delamination at the interfaces and UBM opening. In this work we have made an attempt to simulate the moisture absorption process, subsequent hygroswelling stress development, and thermal stress generated during reflow using established FEA techniques. A generic FC package is used as a test vehicle and the analysis is done for two different underfill materials. Also comparison is made with published results for two different test cases.
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