語系:
繁體中文
English
說明(常見問題)
回圖書館首頁
手機版館藏查詢
登入
回首頁
切換:
標籤
|
MARC模式
|
ISBD
Reliability quantification of printe...
~
Wei, Zishan.
FindBook
Google Book
Amazon
博客來
Reliability quantification of printed circuit boards subjected to thermal and vibration loads.
紀錄類型:
書目-電子資源 : Monograph/item
正題名/作者:
Reliability quantification of printed circuit boards subjected to thermal and vibration loads./
作者:
Wei, Zishan.
面頁冊數:
265 p.
附註:
Source: Dissertation Abstracts International, Volume: 65-12, Section: B, page: 6629.
Contained By:
Dissertation Abstracts International65-12B.
標題:
Engineering, Electronics and Electrical. -
電子資源:
http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3158166
ISBN:
9780496907809
Reliability quantification of printed circuit boards subjected to thermal and vibration loads.
Wei, Zishan.
Reliability quantification of printed circuit boards subjected to thermal and vibration loads.
- 265 p.
Source: Dissertation Abstracts International, Volume: 65-12, Section: B, page: 6629.
Thesis (Ph.D.)--The University of Arizona, 2004.
Reliability quantification is one of the most important tasks in Reliability Engineering. During the design, development, and operational phase, this information can be very valuable to the product's designers, and users. The designers can use it to guide their design, find the design's weak points. Users can use it to setup maintenance plans and schedule.
ISBN: 9780496907809Subjects--Topical Terms:
626636
Engineering, Electronics and Electrical.
Reliability quantification of printed circuit boards subjected to thermal and vibration loads.
LDR
:03221nmm 2200313 4500
001
1829891
005
20070410105516.5
008
130610s2004 eng d
020
$a
9780496907809
035
$a
(UnM)AAI3158166
035
$a
AAI3158166
040
$a
UnM
$c
UnM
100
1
$a
Wei, Zishan.
$3
1918738
245
1 0
$a
Reliability quantification of printed circuit boards subjected to thermal and vibration loads.
300
$a
265 p.
500
$a
Source: Dissertation Abstracts International, Volume: 65-12, Section: B, page: 6629.
500
$a
Director: Dimitri B. Kececioglu.
502
$a
Thesis (Ph.D.)--The University of Arizona, 2004.
520
$a
Reliability quantification is one of the most important tasks in Reliability Engineering. During the design, development, and operational phase, this information can be very valuable to the product's designers, and users. The designers can use it to guide their design, find the design's weak points. Users can use it to setup maintenance plans and schedule.
520
$a
PCBs, as the major building block of electronic equipment, have been widely used in modern complex systems, such as aircraft, automotives, laptop computers, etc. Its reliability plays a vital role in the whole system's reliability. Thus, effective and accurate quantification of PCB's reliability becomes very essential to the whole electronic system's reliability quantification. Random vibration and thermal cycling are two common environments experienced by PCB's. As a result, quantifying the reliability of a PCB under these two environments becomes necessary. Currently, in industry, the commonly used methods to quantify the reliability of a PCB are the MIL-HDBK-217 and Bellcore type methods. However, the lack of accuracy and slow pace of updating the databases have limited the usage of these methods.
520
$a
In this dissertation, a Modified Stress-Strength Interference (MSSI) method is proposed to quantify the reliability of a PCB. In this method, not only the stress and the strength are assumed to be distributed, but also is the mean value of the strength, so that both the initial designed-in reliability and the reliability at any time can be quantified. Based on this method, a reliability quantification model for the PCB is developed. In this model, a PCB is divided into three parts: i.e., board, interconnects, and parts and modules mounted on the board. Seven (7) failure modes related to the board and the interconnects, and one (1) failure mode related to the module have been investigated. The dependence between these failure modes is studied and incorporated into the reliability quantification model. A three-step popcorn effect reliability quantification model is also proposed by means of considering the failure mechanism of the popcorn effect. Finally, a comprehensive example is given to demonstrate the usage of the methodology proposed in this dissertation.
590
$a
School code: 0009.
650
4
$a
Engineering, Electronics and Electrical.
$3
626636
650
4
$a
Engineering, Mechanical.
$3
783786
650
4
$a
Engineering, Packaging.
$3
1025152
690
$a
0544
690
$a
0548
690
$a
0549
710
2 0
$a
The University of Arizona.
$3
1017508
773
0
$t
Dissertation Abstracts International
$g
65-12B.
790
1 0
$a
Kececioglu, Dimitri B.,
$e
advisor
790
$a
0009
791
$a
Ph.D.
792
$a
2004
856
4 0
$u
http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3158166
筆 0 讀者評論
館藏地:
全部
電子資源
出版年:
卷號:
館藏
1 筆 • 頁數 1 •
1
條碼號
典藏地名稱
館藏流通類別
資料類型
索書號
使用類型
借閱狀態
預約狀態
備註欄
附件
W9220754
電子資源
11.線上閱覽_V
電子書
EB
一般使用(Normal)
在架
0
1 筆 • 頁數 1 •
1
多媒體
評論
新增評論
分享你的心得
Export
取書館
處理中
...
變更密碼
登入