語系:
繁體中文
English
說明(常見問題)
回圖書館首頁
手機版館藏查詢
登入
回首頁
切換:
標籤
|
MARC模式
|
ISBD
Electronically conductive adhesives:...
~
Wei, Yong.
FindBook
Google Book
Amazon
博客來
Electronically conductive adhesives: Conduction mechanisms, mechanical behavior and durability.
紀錄類型:
書目-電子資源 : Monograph/item
正題名/作者:
Electronically conductive adhesives: Conduction mechanisms, mechanical behavior and durability./
作者:
Wei, Yong.
面頁冊數:
137 p.
附註:
Source: Dissertation Abstracts International, Volume: 56-04, Section: B, page: 2290.
Contained By:
Dissertation Abstracts International56-04B.
標題:
Engineering, Chemical. -
電子資源:
http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=9527571
Electronically conductive adhesives: Conduction mechanisms, mechanical behavior and durability.
Wei, Yong.
Electronically conductive adhesives: Conduction mechanisms, mechanical behavior and durability.
- 137 p.
Source: Dissertation Abstracts International, Volume: 56-04, Section: B, page: 2290.
Thesis (Ph.D.)--Clarkson University, 1995.
The objective of this research is to provide a fundamental understanding of the conduction mechanisms for electrically conductive adhesives and their applications. This research involves two parts: (a) analysis on mechanical behavior and, (b) analysis on electrical behavior of conductive adhesives. Electrical and mechanical behaviors of both bulk conductive adhesives and single lap joints bonded with a conductive adhesive are studied.Subjects--Topical Terms:
1018531
Engineering, Chemical.
Electronically conductive adhesives: Conduction mechanisms, mechanical behavior and durability.
LDR
:03114nmm 2200313 4500
001
1828438
005
20071030074143.5
008
130610s1995 eng d
035
$a
(UMI)AAI9527571
035
$a
AAI9527571
040
$a
UMI
$c
UMI
100
1
$a
Wei, Yong.
$3
1917337
245
1 0
$a
Electronically conductive adhesives: Conduction mechanisms, mechanical behavior and durability.
300
$a
137 p.
500
$a
Source: Dissertation Abstracts International, Volume: 56-04, Section: B, page: 2290.
500
$a
Adviser: Erol Sancaktar.
502
$a
Thesis (Ph.D.)--Clarkson University, 1995.
520
$a
The objective of this research is to provide a fundamental understanding of the conduction mechanisms for electrically conductive adhesives and their applications. This research involves two parts: (a) analysis on mechanical behavior and, (b) analysis on electrical behavior of conductive adhesives. Electrical and mechanical behaviors of both bulk conductive adhesives and single lap joints bonded with a conductive adhesive are studied.
520
$a
For bulk conductive adhesives, a comparative model was established to predict the conductivity of homogeneous metal particles. Based on this model, experiments were performed to evaluate the contact resistance of particles. Using this model we are also able to study the contact behavior of particle chains in adhesives as predicted by percolation theory. The effect of film thickness on the conduction behavior of conductive adhesives is also presented. To consider mechanical behavior of bulk adhesives, Chow's method was modified to predict the mechanical constants (Young's, shear and bulk moduli). Silver migration problem in silver loaded adhesives was studied analytically and experimentally.
520
$a
Using CDA 151 copper substrates with four different platings, we performed joint durability experiments under environmental attack (humidity and thermal cycling) for conductive adhesive joints. Substrate/adhesive interfacial failure mode was observed in all experiments as expected based on the analysis of the substrate surface topographical and chemical composition. The analyses on the plating surfaces by SEM and Auger reveal that the topographical and chemical composition of substrates will significantly affect the joint behavior both electrically and mechanically. In order to evaluate the thermal mismatch stress induced at the interface between adhesive and substrate, a finite element analysis model was developed and calculated by ANSYS. The results both from finite element method and theoretical analysis are closely fitted.
520
$a
A computer simulation of the current paths for adhesive randomly loaded with metal fillers is developed to bridge the local contact mode to the global conduction behavior of conductive adhesives.
590
$a
School code: 0049.
650
4
$a
Engineering, Chemical.
$3
1018531
650
4
$a
Engineering, Electronics and Electrical.
$3
626636
650
4
$a
Engineering, Mechanical.
$3
783786
690
$a
0542
690
$a
0544
690
$a
0548
710
2 0
$a
Clarkson University.
$3
1020943
773
0
$t
Dissertation Abstracts International
$g
56-04B.
790
1 0
$a
Sancaktar, Erol,
$e
advisor
790
$a
0049
791
$a
Ph.D.
792
$a
1995
856
4 0
$u
http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=9527571
筆 0 讀者評論
館藏地:
全部
電子資源
出版年:
卷號:
館藏
1 筆 • 頁數 1 •
1
條碼號
典藏地名稱
館藏流通類別
資料類型
索書號
使用類型
借閱狀態
預約狀態
備註欄
附件
W9219301
電子資源
11.線上閱覽_V
電子書
EB
一般使用(Normal)
在架
0
1 筆 • 頁數 1 •
1
多媒體
評論
新增評論
分享你的心得
Export
取書館
處理中
...
變更密碼
登入