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Effect of space charges on micro- to...

Wu, Yan.

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Effect of space charges on micro- to nanoscale electrostatic actuation.

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Effect of space charges on micro- to nanoscale electrostatic actuation./
作者:	Wu, Yan.
面頁冊數:	97 p.
附註:	Source: Dissertation Abstracts International, Volume: 66-07, Section: B, page: 3881.
Contained By:	Dissertation Abstracts International66-07B.
標題:	Engineering, Electronics and Electrical. -
電子資源:	http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3182424
ISBN:	9780542234583

Effect of space charges on micro- to nanoscale electrostatic actuation.
Wu, Yan.

Effect of space charges on micro- to nanoscale electrostatic actuation. - 97 p.

Source: Dissertation Abstracts International, Volume: 66-07, Section: B, page: 3881.

Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2005.

The effect of the space charges on the electrodes becomes important on micro- to nanoscale electrostatic actuations because the appropriate phenomenological electrostatic length scale is on the order of the physical scale of the system. A 1-D electromechanical model has been developed to provide quantitative analysis of the effect of the space charges. The electrostatic forces developed between doped silicon/gap/doped silicon electrodes are calculated based on this 1-D model. Departures well over two orders of magnitude in the predicted forces are possible with the consideration of the space charge effect. One key concept that comes out from the theoretical model is the characteristic voltage of a system. Through an example of an electrostatic actuator with a metal/gap/dielectric/doped silicon layered configuration, we demonstrated that when the applied voltage to the actuator is within one order of magnitude of the characteristic voltage, the real electric field within the gap can significantly differ from the 'ideal' electric field predicted without the consideration of the space charges. The characteristic voltage is determined by the surface potential of the space charge layer and the work function difference between the electrodes. Since the surface potential is a quantity that can be measured experimentally, the proposed model can be used to determine the electrostatic force affected by the space charge with an arbitrary charge distribution, without needing to know the exact form of charge distributions. Theoretical results are supported by a set of orthogonal experiments. In the first experiment, the electrostatic force is measured directly using a conductive AFM probe as force sensor. Experimental data demonstrating the effect of the characteristic voltage on the electrostatic force are presented. In the second experiment, the surface potential of the sample is measured using a scanning Kelvin force microscope (SKFM). Experimental data showed that SKFM measurements can be used to determine the characteristic voltage a system experimentally.

ISBN: 9780542234583Subjects--Topical Terms:

626636
Engineering, Electronics and Electrical.

Effect of space charges on micro- to nanoscale electrostatic actuation.
LDR:02987nmm 2200277 4500 001 1824203
005 20061128083232.5
008 130610s2005 eng d
020 $a 9780542234583
035 $a (UnM)AAI3182424
035 $a AAI3182424
040 $a UnM $c UnM
100 1 $a Wu, Yan. $3 1682988
245 1 0 $a Effect of space charges on micro- to nanoscale electrostatic actuation.
300 $a 97 p.
500 $a Source: Dissertation Abstracts International, Volume: 66-07, Section: B, page: 3881.
500 $a Adviser: Mark A. Shannon.
502 $a Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2005.
520 $a The effect of the space charges on the electrodes becomes important on micro- to nanoscale electrostatic actuations because the appropriate phenomenological electrostatic length scale is on the order of the physical scale of the system. A 1-D electromechanical model has been developed to provide quantitative analysis of the effect of the space charges. The electrostatic forces developed between doped silicon/gap/doped silicon electrodes are calculated based on this 1-D model. Departures well over two orders of magnitude in the predicted forces are possible with the consideration of the space charge effect. One key concept that comes out from the theoretical model is the characteristic voltage of a system. Through an example of an electrostatic actuator with a metal/gap/dielectric/doped silicon layered configuration, we demonstrated that when the applied voltage to the actuator is within one order of magnitude of the characteristic voltage, the real electric field within the gap can significantly differ from the 'ideal' electric field predicted without the consideration of the space charges. The characteristic voltage is determined by the surface potential of the space charge layer and the work function difference between the electrodes. Since the surface potential is a quantity that can be measured experimentally, the proposed model can be used to determine the electrostatic force affected by the space charge with an arbitrary charge distribution, without needing to know the exact form of charge distributions. Theoretical results are supported by a set of orthogonal experiments. In the first experiment, the electrostatic force is measured directly using a conductive AFM probe as force sensor. Experimental data demonstrating the effect of the characteristic voltage on the electrostatic force are presented. In the second experiment, the surface potential of the sample is measured using a scanning Kelvin force microscope (SKFM). Experimental data showed that SKFM measurements can be used to determine the characteristic voltage a system experimentally.
590 $a School code: 0090.
650 4 $a Engineering, Electronics and Electrical. $3 626636
650 4 $a Engineering, Materials Science. $3 1017759
690 $a 0544
690 $a 0794
710 2 0 $a University of Illinois at Urbana-Champaign. $3 626646
773 0 $t Dissertation Abstracts International $g 66-07B.
790 1 0 $a Shannon, Mark A., $e advisor
790 $a 0090
791 $a Ph.D.
792 $a 2005
856 4 0 $u http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3182424