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Resistance to tan spot in a syntheti...

Morris, Jana F.

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Resistance to tan spot in a synthetic hexaploid wheat collection measured in a seedling greenhouse assay.

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Resistance to tan spot in a synthetic hexaploid wheat collection measured in a seedling greenhouse assay./
作者:	Morris, Jana F.
面頁冊數:	38 p.
附註:	Source: Masters Abstracts International, Volume: 49-03, page: 1628.
Contained By:	Masters Abstracts International49-03.
標題:	Agriculture, Agronomy. -
電子資源:	http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=1483273
ISBN:	9781124355948

Resistance to tan spot in a synthetic hexaploid wheat collection measured in a seedling greenhouse assay.
Morris, Jana F.

Resistance to tan spot in a synthetic hexaploid wheat collection measured in a seedling greenhouse assay. - 38 p.

Source: Masters Abstracts International, Volume: 49-03, page: 1628.

Thesis (M.S.)--Oklahoma State University, 2009.

Scope and Method of Study: A collection synthetic hexaploid wheat accessions developed at the International Corn and Wheat Improvement Center (CIMMYT) was evaluated for seedling resistance to tan spot in a greenhouse assay. The causal organism of tan spot Pyrenophora trtitici-repentis is an ascomycete that over-seasons on wheat stubble and can cause up to 50% loss in yield in favorable environments. Seedlings planted in a randomized complete block design were inoculated with a chlorosis and necrosis producing isolate collected from Oklahoma and evaluated for percent leaf infection at the 3 to 5 leaf stage one week post-inoculation. Of the 94 synthetic hexaploid wheat accessions tested, 54% showed high resistance when compared to the resistant check, 'Red Chief'. The visual percentage leaf area infection ratings were compared with digital ratings calculated with Assess software (APS Press, 2002). The visual ratings were highly correlated with the digital ratings validating the use of visual estimates of percentage leaf area infection for tan spot reaction.

ISBN: 9781124355948Subjects--Topical Terms:

1018679
Agriculture, Agronomy.

Resistance to tan spot in a synthetic hexaploid wheat collection measured in a seedling greenhouse assay.
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502 $a Thesis (M.S.)--Oklahoma State University, 2009.
520 $a Scope and Method of Study: A collection synthetic hexaploid wheat accessions developed at the International Corn and Wheat Improvement Center (CIMMYT) was evaluated for seedling resistance to tan spot in a greenhouse assay. The causal organism of tan spot Pyrenophora trtitici-repentis is an ascomycete that over-seasons on wheat stubble and can cause up to 50% loss in yield in favorable environments. Seedlings planted in a randomized complete block design were inoculated with a chlorosis and necrosis producing isolate collected from Oklahoma and evaluated for percent leaf infection at the 3 to 5 leaf stage one week post-inoculation. Of the 94 synthetic hexaploid wheat accessions tested, 54% showed high resistance when compared to the resistant check, 'Red Chief'. The visual percentage leaf area infection ratings were compared with digital ratings calculated with Assess software (APS Press, 2002). The visual ratings were highly correlated with the digital ratings validating the use of visual estimates of percentage leaf area infection for tan spot reaction.
520 $a Findings and Conclusions: Synthetic hexaploid wheat is a potential source of resistance to tan spot. Resistance and susceptibility can be assessed using percentage leaf infection in a greenhouse assay.
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