Language:
English
繁體中文
Help
回圖書館首頁
手機版館藏查詢
Login
Back
Switch To:
Labeled
|
MARC Mode
|
ISBD
Reliability of nanoscale circuits an...
~
Stanisavljevic, Milos.{me_controlnum}
Linked to FindBook
Google Book
Amazon
博客來
Reliability of nanoscale circuits and systems = methodologies and circuit architectures /
Record Type:
Electronic resources : Monograph/item
Title/Author:
Reliability of nanoscale circuits and systems/ by Milos Stanisavljevic, Alexandre Schmid, Yusuf Leblebici.
Reminder of title:
methodologies and circuit architectures /
Author:
Stanisavljevic, Milos.{me_controlnum}
other author:
Schmid, Alexandre.
Published:
New York, NY :Springer Science+Business Media, LLC, : 2011.,
Description:
xxvii, 195 p. :digital ;24 cm.
Contained By:
Springer eBooks
Subject:
Nanoelectromechanical systems - Reliability. -
Online resource:
http://dx.doi.org/10.1007/978-1-4419-6217-1
ISBN:
9781441962171 (electronic bk.)
Reliability of nanoscale circuits and systems = methodologies and circuit architectures /
Stanisavljevic, Milos.{me_controlnum}
Reliability of nanoscale circuits and systems
methodologies and circuit architectures /[electronic resource] :by Milos Stanisavljevic, Alexandre Schmid, Yusuf Leblebici. - New York, NY :Springer Science+Business Media, LLC,2011. - xxvii, 195 p. :digital ;24 cm.
ISBN: 9781441962171 (electronic bk.)Subjects--Topical Terms:
1530777
Nanoelectromechanical systems
--Reliability.
LC Class. No.: TK7874.84 / .S73 2011
Dewey Class. No.: 621.3815
Reliability of nanoscale circuits and systems = methodologies and circuit architectures /
LDR
:00827nmm 2200229 a 4500
001
1264431
003
Springer
005
20110502165820.0
006
m d
007
cr nn 008maaau
008
120817s2011 nyu s j eng d
020
$a
9781441962171 (electronic bk.)
020
$a
9781441962164 (paper)
035
$a
978-1-4419-6216-4
050
0 4
$a
TK7874.84
$b
.S73 2011
082
0 4
$a
621.3815
$2
22
090
$a
TK7874.84
$b
.S786 2011
100
1
$a
Stanisavljevic, Milos.{me_controlnum}
$3
1530775
245
1 0
$a
Reliability of nanoscale circuits and systems
$h
[electronic resource] :
$b
methodologies and circuit architectures /
$c
by Milos Stanisavljevic, Alexandre Schmid, Yusuf Leblebici.
260
$a
New York, NY :
$b
Springer Science+Business Media, LLC,
$c
2011.
300
$a
xxvii, 195 p. :
$b
digital ;
$c
24 cm.
650
0
$a
Nanoelectromechanical systems
$x
Reliability.
$3
1530777
650
0
$a
Nanoelectronics.
$3
898422
650
1 4
$a
Engineering.
$3
586835
650
2 4
$a
Circuits and Systems.
$3
896527
650
2 4
$a
Quality Control, Reliability, Safety and Risk.
$3
891027
650
2 4
$a
Computer-Aided Engineering (CAD, CAE) and Design.
$3
892568
700
1
$a
Schmid, Alexandre.
$3
1530776
700
1
$a
Leblebici, Yusuf.
$3
729695
710
2
$a
SpringerLink (Online service)
$3
836513
773
0
$t
Springer eBooks
856
4 0
$u
http://dx.doi.org/10.1007/978-1-4419-6217-1
950
$a
Engineering (Springer-11647)
based on 0 review(s)
Location:
ALL
電子資源
Year:
Volume Number:
Items
1 records • Pages 1 •
1
Inventory Number
Location Name
Item Class
Material type
Call number
Usage Class
Loan Status
No. of reservations
Opac note
Attachments
W9136181
電子資源
11.線上閱覽_V
電子書
EB TK7874.84 .S73 2011
一般使用(Normal)
On shelf
0
1 records • Pages 1 •
1
Multimedia
Reviews
Add a review
and share your thoughts with other readers
Export
pickup library
Processing
...
Change password
Login