Wang, Laung-Terng.
Overview
| Works: | 1 works in 1 publications in 1 languages | |
|---|---|---|
Titles
System-on-chip test architectures : = nanometer design for testability /
by:
Wang, Laung-Terng.; Stroud, Charles E.; Touba, Nur A.
(Language materials, printed)
VLSI test principles and architectures = design for testability /
by:
Wang, Laung-Terng.; Wu, Cheng-Wen, (EE Ph. D.); Wen, Xiaoqing.
(Electronic resources)
System-on-chip test architectures = nanometer design for testability /
by:
Stroud, Charles E.; Touba, Nur A.; Wang, Laung-Terng.; ScienceDirect (Online service)
(Language materials, printed)
Electronic design automation = synthesis, verification, and test /
by:
Chang, Yao-Wen.; Cheng, Kwang-Ting, (1961-); Wang, Laung-Terng.; ScienceDirect (Online service)
(Language materials, printed)
VLSI test principles and architectures : = design for testability /
by:
Wang, Laung-Terng.; Wu, Cheng-Wen, (EE Ph. D.); Wen, Xiaoqing.
(Language materials, printed)
Subjects
Integrated circuits- Very large scale integration
Integrated circuits / Very large scale integration / Testing.
VLSI.
Circuits int�egr�es �a tr�es grande �echelle- Conception et construction.
Circuits int�egr�es �a tr�es grande �echelle- Essais.
Integrated circuits / Very large scale integration / Design.
Electronic circuit design- Data processing.
TECHNOLOGY & ENGINEERING- Electronics
COMPUTERS- Logic Design.
Computer-aided design.
Circuitos integrados vlsi.
Testen.
Systems on a chip- Testing.