葉智翔

晶粒選擇測試機制設計之三維堆疊晶片測試應用 = = Die Selection Test Mechanism Design for 3D-SICs Testing Applications / by: 葉智翔; 許鈞瓏; 林群傑; Yeh, Chih-Hsiang; Hsu, Chun-Lung; Lin, Chun-Chieh (書目-語言資料,印刷品)