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VLSI test principles and architectures : = design for testability /
Record Type:
Language materials, printed : Monograph/item
Title/Author:
VLSI test principles and architectures :/ edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.
Reminder of title:
design for testability /
other author:
Wang, Laung-Terng.
Published:
Amsterdam, The Netherlands ;Elsevier Morgan Kaufmann Publishers, : c2006.,
Description:
xxx, 777 p. :ill. ;25 cm.
Series:
The Morgan Kaufmann series in systems on silicon.
Subject:
Integrated circuits - Very large scale integration -
ISBN:
0123705975 (hbk.) :
VLSI test principles and architectures : = design for testability /
VLSI test principles and architectures :
design for testability /edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen. - Amsterdam, The Netherlands ;Elsevier Morgan Kaufmann Publishers,c2006. - xxx, 777 p. :ill. ;25 cm. - The Morgan Kaufmann series in systems on silicon..
Includes bibliographical references and index.
ISBN: 0123705975 (hbk.) :NT1350Subjects--Topical Terms:
629092
Integrated circuits
--Very large scale integration
LC Class. No.: TK7874.75 / .V587 2006
Dewey Class. No.: 621.39/5
VLSI test principles and architectures : = design for testability /
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VLSI test principles and architectures :
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design for testability /
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edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.
260
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Amsterdam, The Netherlands ;
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Boston :
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c2006.
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Elsevier Morgan Kaufmann Publishers,
300
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xxx, 777 p. :
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ill. ;
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25 cm.
440
4
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The Morgan Kaufmann series in systems on silicon.
504
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Includes bibliographical references and index.
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Integrated circuits
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Very large scale integration
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Testing.
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629092
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Integrated circuits
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Very large scale integration
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629093
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Wang, Laung-Terng.
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Wu, Cheng-Wen,
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EE Ph. D.
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983122
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Wen, Xiaoqing.
$3
983123
based on 0 review(s)
Location:
ALL
六樓西文書區HC-Z(6F Western Language Books)
Year:
Volume Number:
Items
1 records • Pages 1 •
1
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W0191244
六樓西文書區HC-Z(6F Western Language Books)
01.外借(書)_YB
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TK7874.75 V587 2006
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