Metal oxide semiconductors, Complementary - Effect of temperature on.

Recent advances in PMOS negative bias temperature instability = characterization and modeling of device architecture, material and process impact / by: (Electronic resources)

Solid State Physics.

Electronics and Microelectronics, Instrumentation.

Metal oxide semiconductors, Complementary- Effect of temperature on.

Circuits and Systems.

Metal oxide semiconductors, Complementary- Reliability.