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Integrated circuits - Testing.
概要
作品:
6 作品在 3 項出版品 3 種語言
書目資訊
Analog signal generation for built-in-self-test of mixed-signal integrated circuits /
by:
(書目-語言資料,印刷品)
Design for at-speed test, diagnosis, and measurement
by:
(書目-語言資料,印刷品)
Nanometer technology designs = high-quality delay tests /
by:
(書目-語言資料,印刷品)
High quality test pattern generation and boolean satisfiability
by:
(書目-電子資源)
Counterfeit integrated circuits = detection and avoidance /
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(書目-電子資源)
Design for testability, debug and reliability = next generation measures using formal techniques /
by:
(書目-電子資源)
主題
Product counterfeiting.
Nanotechnology.
Electronics and Microelectronics, Instrumentation.
Algebra, Boolean.
Debugging in computer science.
Integrated circuits- Testing.
Signal generators- Design and construction.
Electronic apparatus and appliances- Testing.
Integrated circuits- Very large scale integration.
Computer-Aided Engineering (CAD, CAE) and Design.
Processor Architectures.
Integrated circuits- Verification.
Integrated circuits- Design and construction.
Appareils 歋lectroniques- Essais.
Circuits and Systems.
Integrated circuits- Reliability.
Nanoelectronics.
Engineering.
Electrical Engineering.
Signal processing- Digital techniques.
Circuits int歋gr歋s- Essais.
Electronic Circuits and Devices.
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