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Metal oxide semiconductors, Complementary - Effect of temperature on.
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1 作品在 1 項出版品 1 種語言
書目資訊
Recent advances in PMOS negative bias temperature instability = characterization and modeling of device architecture, material and process impact /
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(書目-電子資源)
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Solid State Physics.
Electronics and Microelectronics, Instrumentation.
Metal oxide semiconductors, Complementary- Effect of temperature on.
Circuits and Systems.
Metal oxide semiconductors, Complementary- Reliability.
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