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Exploiting passive polarimetric imag...

Vimal Thilak Krishna, Thilakam.

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Exploiting passive polarimetric imagery for remote sensing applications.

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Exploiting passive polarimetric imagery for remote sensing applications./
Author:	Vimal Thilak Krishna, Thilakam.
Description:	109 p.
Notes:	Adviser: Charles D. Creusere.
Contained By:	Dissertation Abstracts International69-04B.
Subject:	Engineering, Electronics and Electrical. -
Online resource:	http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3310444
ISBN:	9780549590200

Exploiting passive polarimetric imagery for remote sensing applications.
Vimal Thilak Krishna, Thilakam.

Exploiting passive polarimetric imagery for remote sensing applications. - 109 p.

Adviser: Charles D. Creusere.

Thesis (Ph.D.)--New Mexico State University, 2008.

Polarization is a property of light or electromagnetic radiation that conveys information about the orientation of the transverse electric and magnetic fields. The polarization of reflected light complements other electromagnetic radiation attributes such as intensity, frequency, or spectral characteristics. A passive polarization based imaging system records the polarization state of light reflected by objects that are illuminated with an unpolarized and generally uncontrolled source. The polarization due to surface reflections from such objects contains information about the targets that can be exploited in remote sensing applications such as target detection, target classification, object recognition and shape extraction/recognition. In recent years, there has been renewed interest in the use of passive polarization information in remote sensing applications.

ISBN: 9780549590200Subjects--Topical Terms:

626636
Engineering, Electronics and Electrical.

Exploiting passive polarimetric imagery for remote sensing applications.
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020 $a 9780549590200
035 $a (UMI)AAI3310444
035 $a AAI3310444
040 $a UMI $c UMI
100 1 $a Vimal Thilak Krishna, Thilakam. $3 1264095
245 1 0 $a Exploiting passive polarimetric imagery for remote sensing applications.
300 $a 109 p.
500 $a Adviser: Charles D. Creusere.
500 $a Source: Dissertation Abstracts International, Volume: 69-04, Section: B, page: 2543.
502 $a Thesis (Ph.D.)--New Mexico State University, 2008.
520 $a Polarization is a property of light or electromagnetic radiation that conveys information about the orientation of the transverse electric and magnetic fields. The polarization of reflected light complements other electromagnetic radiation attributes such as intensity, frequency, or spectral characteristics. A passive polarization based imaging system records the polarization state of light reflected by objects that are illuminated with an unpolarized and generally uncontrolled source. The polarization due to surface reflections from such objects contains information about the targets that can be exploited in remote sensing applications such as target detection, target classification, object recognition and shape extraction/recognition. In recent years, there has been renewed interest in the use of passive polarization information in remote sensing applications.
520 $a The goal of our research is to design image processing algorithms for remote sensing applications by utilizing physics-based models that describe the polarization imparted by optical scattering from an object. In this dissertation, we present a method to estimate the complex index of refraction and reflection angle from multiple polarization measurements. This method employs a polarimetric bidirectional reflectance distribution function (pBRDF) that accounts for polarization due to specular scattering. The parameters of interest are derived by utilizing a nonlinear least squares estimation algorithm, and computer simulation results show that the estimation accuracy generally improves with an increasing number of source position measurements. Furthermore, laboratory results indicate that the proposed method is effective for recovering the reflection angle and that the estimated index of refraction provides a feature vector that is robust to the reflection angle.
520 $a We also study the use of extracted index of refraction as a feature vector in designing two important image processing applications, namely image segmentation and material classification so that the resulting systems are largely invariant to illumination source location. This is in contrast to most passive polarization-based image processing algorithms proposed in the literature that employ quantities such as Stokes vectors and the degree of polarization and which are not robust to changes in illumination conditions. The estimated index of refraction, on the other hand, is invariant to illumination conditions and hence can be used as an input to image processing algorithms. The proposed estimation framework also is extended to the case where the position of the observer (camera) moves between measurements while that of the source remains fixed. Finally, we explore briefly the topic of parameter estimation for a generalized model that accounts for both specular and volumetric scattering. A combination of simulation and experimental results are provided to evaluate the effectiveness of the above methods.
590 $a School code: 0143.
650 4 $a Engineering, Electronics and Electrical. $3 626636
650 4 $a Physics, Optics. $3 1018756
650 4 $a Remote Sensing. $3 1018559
690 $a 0544
690 $a 0752
690 $a 0799
710 2 $a New Mexico State University. $3 783784
773 0 $t Dissertation Abstracts International $g 69-04B.
790 $a 0143
790 1 0 $a Creusere, Charles D., $e advisor
791 $a Ph.D.
792 $a 2008
856 4 0 $u http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3310444