東華大學圖書館 |

Language: English

Help

回圖書館首頁

手機版館藏查詢

Back

Switch To: Labeled | MARC Mode | ISBD

The role of bandgap in the secondary...

Nickles, Neal Edward.

Linked to FindBook

Google Book

Amazon

博客來

The role of bandgap in the secondary electron emission of small bandgap semiconductors: Studies of graphitic carbon.

Record Type:	Language materials, printed : Monograph/item
Title/Author:	The role of bandgap in the secondary electron emission of small bandgap semiconductors: Studies of graphitic carbon./
Author:	Nickles, Neal Edward.
Description:	236 p.
Notes:	Major Professor: J. R. Dennison.
Contained By:	Dissertation Abstracts International64-01B.
Subject:	Physics, Condensed Matter. -
Online resource:	http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3077211
ISBN:	0493977309

The role of bandgap in the secondary electron emission of small bandgap semiconductors: Studies of graphitic carbon.
Nickles, Neal Edward.

The role of bandgap in the secondary electron emission of small bandgap semiconductors: Studies of graphitic carbon. - 236 p.

Major Professor: J. R. Dennison.

Thesis (Ph.D.)--Utah State University, 2002.

The question of whether the small bandgaps of semiconductors play a significant role in their secondary electron emission properties is investigated by studying evaporated graphitic amorphous carbon, which has a roughly 0.5 eV bandgap, in comparison with microcrystalline graphite, which has zero bandgap. The graphitic amorphous carbon is found to have a 30% increase in its maximum secondary electron yield over that of two microcrystalline graphite samples with comparable secondary electron yields: highly oriented pyrolytic graphite and colloidal graphite. The potentially confounding influence of the vacuum level has been isolated through the measurement of the photoelectron onset energy of the materials. Other less significant materials parameters are also isolated and discussed. Based on these measurements, it is concluded the magnitude of bandgap may have an appreciable effect on the magnitude of the secondary electron yield and further studies of this effect with annealed graphitic amorphous carbon are warranted.

ISBN: 0493977309Subjects--Topical Terms:

1018743
Physics, Condensed Matter.

The role of bandgap in the secondary electron emission of small bandgap semiconductors: Studies of graphitic carbon.
LDR:03310nam 2200289 a 45 001 936220
005 20110510
008 110510s2002 eng d
020 $a 0493977309
035 $a (UnM)AAI3077211
035 $a AAI3077211
040 $a UnM $c UnM
100 1 $a Nickles, Neal Edward. $3 1259912
245 1 0 $a The role of bandgap in the secondary electron emission of small bandgap semiconductors: Studies of graphitic carbon.
300 $a 236 p.
500 $a Major Professor: J. R. Dennison.
500 $a Source: Dissertation Abstracts International, Volume: 64-01, Section: B, page: 0261.
502 $a Thesis (Ph.D.)--Utah State University, 2002.
520 $a The question of whether the small bandgaps of semiconductors play a significant role in their secondary electron emission properties is investigated by studying evaporated graphitic amorphous carbon, which has a roughly 0.5 eV bandgap, in comparison with microcrystalline graphite, which has zero bandgap. The graphitic amorphous carbon is found to have a 30% increase in its maximum secondary electron yield over that of two microcrystalline graphite samples with comparable secondary electron yields: highly oriented pyrolytic graphite and colloidal graphite. The potentially confounding influence of the vacuum level has been isolated through the measurement of the photoelectron onset energy of the materials. Other less significant materials parameters are also isolated and discussed. Based on these measurements, it is concluded the magnitude of bandgap may have an appreciable effect on the magnitude of the secondary electron yield and further studies of this effect with annealed graphitic amorphous carbon are warranted.
520 $a In support of this work, a hemispherical two-grid, retarding field electron energy analyzer has been designed, constructed, and characterized for the present work. The advantages and disadvantages of the analyzer are discussed in comparison to other methods of measuring secondary electron emission. The analyzer has a resolution of ±(1.5 eV + 4% of the incident electron energy). A novel effort to derive theoretical, absolute correction factors that compensate for electron losses within the analyzer, mainly due to the grid transmission, is presented. The corrected secondary electron yield of polycrystalline gold is found to be 30% above comparable experimental studies. The corrected backscattered electron yield of polycrystalline gold is found to be 14% above comparable experimental studies. Corrected secondary yields for the microcrystalline graphite samples are found to range from 35–70% above those found in five experimental studies in the literature. The theoretical correction factors are estimated to have a 4–6% uncertainty. Reasons for the large discrepancy in yield measurements with the analyzer are discussed and thought to be due mainly to the lack of similar corrective factors in the previous studies. The supporting instrumentation is fully characterized, including a detailed error analysis.
590 $a School code: 0241.
650 4 $a Physics, Condensed Matter. $3 1018743
650 4 $a Physics, Electricity and Magnetism. $3 1019535
690 $a 0607
690 $a 0611
710 2 0 $a Utah State University. $3 960049
773 0 $t Dissertation Abstracts International $g 64-01B.
790 $a 0241
790 1 0 $a Dennison, J. R., $e advisor
791 $a Ph.D.
792 $a 2002
856 4 0 $u http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3077211