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The role of bandgap in the secondary...

Nickles, Neal Edward.

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The role of bandgap in the secondary electron emission of small bandgap semiconductors: Studies of graphitic carbon.

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	The role of bandgap in the secondary electron emission of small bandgap semiconductors: Studies of graphitic carbon./
作者:	Nickles, Neal Edward.
面頁冊數:	236 p.
附註:	Major Professor: J. R. Dennison.
Contained By:	Dissertation Abstracts International64-01B.
標題:	Physics, Condensed Matter. -
電子資源:	http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3077211
ISBN:	0493977309

The role of bandgap in the secondary electron emission of small bandgap semiconductors: Studies of graphitic carbon.
Nickles, Neal Edward.

The role of bandgap in the secondary electron emission of small bandgap semiconductors: Studies of graphitic carbon. - 236 p.

Major Professor: J. R. Dennison.

Thesis (Ph.D.)--Utah State University, 2002.

The question of whether the small bandgaps of semiconductors play a significant role in their secondary electron emission properties is investigated by studying evaporated graphitic amorphous carbon, which has a roughly 0.5 eV bandgap, in comparison with microcrystalline graphite, which has zero bandgap. The graphitic amorphous carbon is found to have a 30% increase in its maximum secondary electron yield over that of two microcrystalline graphite samples with comparable secondary electron yields: highly oriented pyrolytic graphite and colloidal graphite. The potentially confounding influence of the vacuum level has been isolated through the measurement of the photoelectron onset energy of the materials. Other less significant materials parameters are also isolated and discussed. Based on these measurements, it is concluded the magnitude of bandgap may have an appreciable effect on the magnitude of the secondary electron yield and further studies of this effect with annealed graphitic amorphous carbon are warranted.

ISBN: 0493977309Subjects--Topical Terms:

1018743
Physics, Condensed Matter.

The role of bandgap in the secondary electron emission of small bandgap semiconductors: Studies of graphitic carbon.
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100 1 $a Nickles, Neal Edward. $3 1259912
245 1 0 $a The role of bandgap in the secondary electron emission of small bandgap semiconductors: Studies of graphitic carbon.
300 $a 236 p.
500 $a Major Professor: J. R. Dennison.
500 $a Source: Dissertation Abstracts International, Volume: 64-01, Section: B, page: 0261.
502 $a Thesis (Ph.D.)--Utah State University, 2002.
520 $a The question of whether the small bandgaps of semiconductors play a significant role in their secondary electron emission properties is investigated by studying evaporated graphitic amorphous carbon, which has a roughly 0.5 eV bandgap, in comparison with microcrystalline graphite, which has zero bandgap. The graphitic amorphous carbon is found to have a 30% increase in its maximum secondary electron yield over that of two microcrystalline graphite samples with comparable secondary electron yields: highly oriented pyrolytic graphite and colloidal graphite. The potentially confounding influence of the vacuum level has been isolated through the measurement of the photoelectron onset energy of the materials. Other less significant materials parameters are also isolated and discussed. Based on these measurements, it is concluded the magnitude of bandgap may have an appreciable effect on the magnitude of the secondary electron yield and further studies of this effect with annealed graphitic amorphous carbon are warranted.
520 $a In support of this work, a hemispherical two-grid, retarding field electron energy analyzer has been designed, constructed, and characterized for the present work. The advantages and disadvantages of the analyzer are discussed in comparison to other methods of measuring secondary electron emission. The analyzer has a resolution of ±(1.5 eV + 4% of the incident electron energy). A novel effort to derive theoretical, absolute correction factors that compensate for electron losses within the analyzer, mainly due to the grid transmission, is presented. The corrected secondary electron yield of polycrystalline gold is found to be 30% above comparable experimental studies. The corrected backscattered electron yield of polycrystalline gold is found to be 14% above comparable experimental studies. Corrected secondary yields for the microcrystalline graphite samples are found to range from 35–70% above those found in five experimental studies in the literature. The theoretical correction factors are estimated to have a 4–6% uncertainty. Reasons for the large discrepancy in yield measurements with the analyzer are discussed and thought to be due mainly to the lack of similar corrective factors in the previous studies. The supporting instrumentation is fully characterized, including a detailed error analysis.
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650 4 $a Physics, Condensed Matter. $3 1018743
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791 $a Ph.D.
792 $a 2002
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