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Experimental techniques for low-temp...

Ekin, J. W.

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Experimental techniques for low-temperature measurements = cryostat design, material properties, and superconductor critical-current testing /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Experimental techniques for low-temperature measurements/ Jack W. Ekin.
其他題名:	cryostat design, material properties, and superconductor critical-current testing /
作者:	Ekin, J. W.
出版者:	Oxford ;Oxford University Press, : 2006.,
面頁冊數:	xxviii, 673 p. :ill. ;26 cm.
標題:	Low temperature research. -
電子資源:	http://dx.doi.org/10.1093/acprof:oso/9780198570547.001.0001
ISBN:	9780198570547

Experimental techniques for low-temperature measurements = cryostat design, material properties, and superconductor critical-current testing /
Ekin, J. W.

Experimental techniques for low-temperature measurementscryostat design, material properties, and superconductor critical-current testing /[electronic resource] :Jack W. Ekin. - Oxford ;Oxford University Press,2006. - xxviii, 673 p. :ill. ;26 cm.

Includes bibliographical references and index.

Electronic reproduction.
Oxford :
Oxford University Press,
2010.

(Oxford Scholarship Online).

Mode of access: World Wide Web. System requirements: Internet Explorer 6.0 (or higher) or Firefox 2.0 (or higher).

ISBN: 9780198570547

LCCN: 2006010332Subjects--Topical Terms:

601029
Low temperature research.

LC Class. No.: QC278 / .E45 2006

Dewey Class. No.: 536/.54

Experimental techniques for low-temperature measurements = cryostat design, material properties, and superconductor critical-current testing /
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504 $a Includes bibliographical references and index.
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