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Power-aware testing and test strateg...
~
Girard, Patrick.
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Power-aware testing and test strategies for low power devices
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Power-aware testing and test strategies for low power devices/ edited by Patrick Girard, Nicola Nicolici, Xiaoqing Wen.
other author:
Girard, Patrick.
Published:
Boston, MA :Springer Science+Business Media, LLC, : 2010.,
Description:
382 p. :ill., digital ;24 cm.
Contained By:
Springer eBooks
Subject:
Low voltage integrated circuits - Power supply. -
Online resource:
http://dx.doi.org/10.1007/978-1-4419-0928-2
ISBN:
9781441909275 (paper)
Power-aware testing and test strategies for low power devices
Power-aware testing and test strategies for low power devices
[electronic resource] /edited by Patrick Girard, Nicola Nicolici, Xiaoqing Wen. - Boston, MA :Springer Science+Business Media, LLC,2010. - 382 p. :ill., digital ;24 cm.
ISBN: 9781441909275 (paper)Subjects--Topical Terms:
1086105
Low voltage integrated circuits
--Power supply.
LC Class. No.: TK7874 / .P69 2010
Dewey Class. No.: 621.3815
Power-aware testing and test strategies for low power devices
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edited by Patrick Girard, Nicola Nicolici, Xiaoqing Wen.
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2010.
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382 p. :
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ill., digital ;
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24 cm.
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Low voltage integrated circuits
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Low voltage integrated circuits
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Circuits and Systems.
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Girard, Patrick.
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Nicolici, Nicola.
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Wen, Xiaoqing.
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http://dx.doi.org/10.1007/978-1-4419-0928-2
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Engineering (Springer-11647)
based on 0 review(s)
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Items
1 records • Pages 1 •
1
Inventory Number
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No. of reservations
Opac note
Attachments
W9090373
電子資源
11.線上閱覽_V
電子書
EB W9090373
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1 records • Pages 1 •
1
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