Transmission electron microscopy of ...
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  • Transmission electron microscopy of semiconductor nanostructures = an analysis of composition and strain state /
  • Record Type: Language materials, printed : Monograph/item
    Title/Author: Transmission electron microscopy of semiconductor nanostructures/ Andreas Rosenauer.
    Reminder of title: an analysis of composition and strain state /
    Author: Rosenauer, Andreas,
    Published: Berlin ;Springer, : c2003.,
    Description: xii, 238 p. :ill. (some col.), digital ;24 cm.
    Series: Springer tracts in modern physics ;
    Contained By: Springer e-books
    Subject: Semiconductors - Analysis. -
    Online resource: http://dx.doi.org/10.1007/3-540-36407-2
    ISBN: 9783540004141 (paper)
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