東華大學圖書館 |

語系: 繁體中文

登入

回首頁

切換: 標籤 | MARC模式 | ISBD

Transmission electron microscopy of ...

SpringerLink (Online service)

FindBook

Amazon

博客來

Transmission electron microscopy of semiconductor nanostructures = an analysis of composition and strain state /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Transmission electron microscopy of semiconductor nanostructures/ Andreas Rosenauer.
其他題名:	an analysis of composition and strain state /
作者:	Rosenauer, Andreas,
出版者:	Berlin ;Springer, : c2003.,
面頁冊數:	xii, 238 p. :ill. (some col.), digital ;24 cm.
叢書名:	Springer tracts in modern physics ;
Contained By:	Springer e-books
標題:	Semiconductors - Analysis. -
電子資源:	http://dx.doi.org/10.1007/3-540-36407-2
ISBN:	9783540004141 (paper)

Transmission electron microscopy of semiconductor nanostructures = an analysis of composition and strain state /
Rosenauer, Andreas,1964-

Transmission electron microscopy of semiconductor nanostructuresan analysis of composition and strain state /[electronic resource] :Andreas Rosenauer. - Berlin ;Springer,c2003. - xii, 238 p. :ill. (some col.), digital ;24 cm. - Springer tracts in modern physics ;182.

ISBN: 9783540004141 (paper)Subjects--Topical Terms:

1004249
Semiconductors
--Analysis.

LC Class. No.: QD139.S34 / R67 2003

Dewey Class. No.: 621.38152

Transmission electron microscopy of semiconductor nanostructures = an analysis of composition and strain state /
LDR:00777nam 2200217 a 45 001 843437
003 GreenPo
005 20100602
006 m d
007 cr nn 008maaau
008 100602s2003 gw j eng d
020 $a 9783540004141 (paper)
035 $a 978-3-540-00414-1
050 0 0 $a QD139.S34 $b R67 2003
082 0 0 $a 621.38152 $2 21
100 1 $a Rosenauer, Andreas, $d 1964- $3 1004248
245 1 0 $a Transmission electron microscopy of semiconductor nanostructures $h [electronic resource] : $b an analysis of composition and strain state / $c Andreas Rosenauer.
260 $a Berlin ; $a New York : $c c2003. $b Springer,
300 $a xii, 238 p. : $b ill. (some col.), digital ; $c 24 cm.
440 0 $a Springer tracts in modern physics ; $v 182
650 0 $a Semiconductors $x Analysis. $3 1004249
650 0 $a Semiconductors $x Microscopy. $3 1004250
650 0 $a Transmission electron microscopy. $3 567074
710 2 $a SpringerLink (Online service) $3 836513
773 0 $t Springer e-books
856 4 0 $u http://dx.doi.org/10.1007/3-540-36407-2
950 $a Physics and Astronomy