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Transmission electron microscopy of semiconductor nanostructures = an analysis of composition and strain state /
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Transmission electron microscopy of semiconductor nanostructures/ Andreas Rosenauer.
Reminder of title:
an analysis of composition and strain state /
Author:
Rosenauer, Andreas,
Published:
Berlin ;Springer, : c2003.,
Description:
xii, 238 p. :ill. (some col.), digital ;24 cm.
Series:
Springer tracts in modern physics ;
Contained By:
Springer e-books
Subject:
Semiconductors - Analysis. -
Online resource:
http://dx.doi.org/10.1007/3-540-36407-2
ISBN:
9783540004141 (paper)
Transmission electron microscopy of semiconductor nanostructures = an analysis of composition and strain state /
Rosenauer, Andreas,1964-
Transmission electron microscopy of semiconductor nanostructures
an analysis of composition and strain state /[electronic resource] :Andreas Rosenauer. - Berlin ;Springer,c2003. - xii, 238 p. :ill. (some col.), digital ;24 cm. - Springer tracts in modern physics ;182.
ISBN: 9783540004141 (paper)Subjects--Topical Terms:
1004249
Semiconductors
--Analysis.
LC Class. No.: QD139.S34 / R67 2003
Dewey Class. No.: 621.38152
Transmission electron microscopy of semiconductor nanostructures = an analysis of composition and strain state /
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an analysis of composition and strain state /
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Andreas Rosenauer.
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c2003.
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xii, 238 p. :
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24 cm.
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Springer tracts in modern physics ;
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Semiconductors
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Analysis.
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1004249
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Semiconductors
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1004250
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Transmission electron microscopy.
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http://dx.doi.org/10.1007/3-540-36407-2
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Physics and Astronomy
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1
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W9063235
電子資源
11.線上閱覽_V
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EB W9063235
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