東華大學圖書館 |

語系: 繁體中文

說明(常見問題)

回圖書館首頁

手機版館藏查詢

登入

回首頁

切換: 標籤 | MARC模式 | ISBD

Characterization of semiconductor he...

Lamberti, Carlo.

FindBook

Google Book

Amazon

博客來

Characterization of semiconductor heterostructures and nanostructures

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Characterization of semiconductor heterostructures and nanostructures/ edited by Carlo Lamberti.
其他作者:	Lamberti, Carlo.
出版者:	Amsterdam ;Elsevier, : 2008.,
面頁冊數:	ix, 486 p., [3] p. of plates :ill. (some col.) ;25 cm.
內容註:	Chapter 1. Introduction (C. Lamberti) -- Chapter 2. Ab-initio studies of structural and electronic properties (M. Peressi, A. Baldereschi and S. Baroni) -- Chapter 3. Electrical and optical properties of heterostructures (TBC) -- Chapter 4. Strain and composition determination in semiconducting heterostructures by high resolution X-ray diffraction (C. Ferrari and C. Bocchi) -- Chapter 5. Transmission Electron Microscopy techniques for imaging and composition evaluation in Semiconductor Heterostructures (L. Lazzarini, L. Nasi and V. Grillo) -- Chapter 6. Accessing structural and electronic properties of semiconductor nanostructures via photoluminescence (S. Sanguinetti, M. Guzzi and M. Gurioli) -- Chapter 7. Power dependent cathodoluminescence in III-Nitrides heterostructures: from internal field screening to controlled band gap modulation (G. Salviati, L. Lazzarini, N. Armani, F. Rossi and V. Grillo) -- Chapter 8. Raman Spectroscopy (D. Wolverson) -- Chapter 9. X-ray absorption fine structure spectroscopy (F. Boscherini) -- Chapter 10. Nanostructures in the light of synchrotron radiation: surface sensitive x-ray techniques and anomalous scattering (T. Metzger, J. Eymery, V. Favre-Nicolin, G. Renaud, H. Renevier and T. Schulli) -- Chapter 11. Grazing Incidence Diffraction Anomalous Fine Structure to study the structural properties of semiconductor nanostructures (M. Grazia Proietti, J. Coraux and H. Renevier) -- Chapter 12. The Role of Photoemission Spectroscopies in Heterojunction Research (G. Margaritondo) -- Chapter 13. EPR of interfaces and nanolayers in semiconductor heterostructures (A. Stesmans and V.V. Afans'ev).
標題:	Heterostructures. -
電子資源:	http://www.sciencedirect.com/science/book/9780444530998An electronic book accessible through the World Wide Web; click for information
ISBN:	0444530991

Characterization of semiconductor heterostructures and nanostructures
Characterization of semiconductor heterostructures and nanostructures[electronic resource] /edited by Carlo Lamberti. - 1st ed. - Amsterdam ;Elsevier,2008. - ix, 486 p., [3] p. of plates :ill. (some col.) ;25 cm.

Includes bibliographical references and index.

Chapter 1. Introduction (C. Lamberti) -- Chapter 2. Ab-initio studies of structural and electronic properties (M. Peressi, A. Baldereschi and S. Baroni) -- Chapter 3. Electrical and optical properties of heterostructures (TBC) -- Chapter 4. Strain and composition determination in semiconducting heterostructures by high resolution X-ray diffraction (C. Ferrari and C. Bocchi) -- Chapter 5. Transmission Electron Microscopy techniques for imaging and composition evaluation in Semiconductor Heterostructures (L. Lazzarini, L. Nasi and V. Grillo) -- Chapter 6. Accessing structural and electronic properties of semiconductor nanostructures via photoluminescence (S. Sanguinetti, M. Guzzi and M. Gurioli) -- Chapter 7. Power dependent cathodoluminescence in III-Nitrides heterostructures: from internal field screening to controlled band gap modulation (G. Salviati, L. Lazzarini, N. Armani, F. Rossi and V. Grillo) -- Chapter 8. Raman Spectroscopy (D. Wolverson) -- Chapter 9. X-ray absorption fine structure spectroscopy (F. Boscherini) -- Chapter 10. Nanostructures in the light of synchrotron radiation: surface sensitive x-ray techniques and anomalous scattering (T. Metzger, J. Eymery, V. Favre-Nicolin, G. Renaud, H. Renevier and T. Schulli) -- Chapter 11. Grazing Incidence Diffraction Anomalous Fine Structure to study the structural properties of semiconductor nanostructures (M. Grazia Proietti, J. Coraux and H. Renevier) -- Chapter 12. The Role of Photoemission Spectroscopies in Heterojunction Research (G. Margaritondo) -- Chapter 13. EPR of interfaces and nanolayers in semiconductor heterostructures (A. Stesmans and V.V. Afans'ev).

Electronic reproduction.
Amsterdam :
Elsevier Science & Technology,
2008.

Mode of access: World Wide Web.

ISBN: 0444530991

Source: 137897:138034Elsevier Science & Technologyhttp://www.sciencedirect.comSubjects--Topical Terms:

714845
Heterostructures.
Index Terms--Genre/Form:

542853
Electronic books.

LC Class. No.: QC176.8.N35 / C45 2008eb

Dewey Class. No.: 537.6226

Characterization of semiconductor heterostructures and nanostructures
LDR:04825cam 2200313 a 45 001 841310
003 OCoLC
005 20100601
006 m d
007 cr cn|||||||||
008 100601s2008 ne a sb 001 0 eng d
020 $a 0444530991
020 $a 9780444530998
035 $a (OCoLC)272383191
035 $a ocn272383191
037 $a 137897:138034 $b Elsevier Science & Technology $n http://www.sciencedirect.com
040 $a OPELS $b eng $c OPELS $d OPELS
049 $a TEFA
050 1 4 $a QC176.8.N35 $b C45 2008eb
082 0 4 $a 537.6226 $2 22
245 0 0 $a Characterization of semiconductor heterostructures and nanostructures $h [electronic resource] / $c edited by Carlo Lamberti.
250 $a 1st ed.
260 $a Amsterdam ; $a Oxford : $c 2008. $b Elsevier,
300 $a ix, 486 p., [3] p. of plates : $b ill. (some col.) ; $c 25 cm.
504 $a Includes bibliographical references and index.
505 0 $a Chapter 1. Introduction (C. Lamberti) -- Chapter 2. Ab-initio studies of structural and electronic properties (M. Peressi, A. Baldereschi and S. Baroni) -- Chapter 3. Electrical and optical properties of heterostructures (TBC) -- Chapter 4. Strain and composition determination in semiconducting heterostructures by high resolution X-ray diffraction (C. Ferrari and C. Bocchi) -- Chapter 5. Transmission Electron Microscopy techniques for imaging and composition evaluation in Semiconductor Heterostructures (L. Lazzarini, L. Nasi and V. Grillo) -- Chapter 6. Accessing structural and electronic properties of semiconductor nanostructures via photoluminescence (S. Sanguinetti, M. Guzzi and M. Gurioli) -- Chapter 7. Power dependent cathodoluminescence in III-Nitrides heterostructures: from internal field screening to controlled band gap modulation (G. Salviati, L. Lazzarini, N. Armani, F. Rossi and V. Grillo) -- Chapter 8. Raman Spectroscopy (D. Wolverson) -- Chapter 9. X-ray absorption fine structure spectroscopy (F. Boscherini) -- Chapter 10. Nanostructures in the light of synchrotron radiation: surface sensitive x-ray techniques and anomalous scattering (T. Metzger, J. Eymery, V. Favre-Nicolin, G. Renaud, H. Renevier and T. Schulli) -- Chapter 11. Grazing Incidence Diffraction Anomalous Fine Structure to study the structural properties of semiconductor nanostructures (M. Grazia Proietti, J. Coraux and H. Renevier) -- Chapter 12. The Role of Photoemission Spectroscopies in Heterojunction Research (G. Margaritondo) -- Chapter 13. EPR of interfaces and nanolayers in semiconductor heterostructures (A. Stesmans and V.V. Afans'ev).
505 0 0 $t Introduction: the interdisciplinary nature of nanotechnology and its need to exploit frontier characterization techniques / $r Carlo Lamberti -- $t Ab initio studies of structural and electronic properties/ $r Maria Peressi, Alfonso Baldereschi, and Stefano Baroni -- $t Electrical characterization of nanostructures/ $r Anna Cavallini and Laura Polenta -- $t Strain and composition determination in semiconducting heterostructures by high-resolution X-ray diffraction/ $r Claudio Ferrari and Claudio Bocchi -- $t Transmission electron microscopy techniques for imaging and compositional evaluation in semiconductor heterostructures/ $r Laura Lazzarini, Lucia Nasi, and Vincenzo Grillo -- $t Accessing structural and electronic properties of semiconductor nanostructures via photoluminescence/ $r Stefano Sanguinetti, Mario Guzzi, and Massimo Gurioli -- $t Power-dependent cathodoluminescence in III-nitrides heterostructures: from internal field screening to controlled band-gap modulation/ $r Giancarlo Salviati, Francesca Rossi, Nicola Armani, Vincenzo Grillo, and Laura Lazzarini -- $t Raman spectroscopy / $r Daniel Wolverson -- $t X-ray absorption fine structure in the study of semiconductor heterostructures and nanostructures/ $r Federico Boscherini -- $t Nanostructures in the light of synchrotron radiation: surface-sensitive X-ray techniques and anomalous scattering/ $r Till Metzger, Vincent Favre-Nicolin, Gilles Renaud, Hubert Renevier, and Tobias Sch�ulli -- $t Grazing incidence diffraction anomalous fine structure in the study of structural properties of nanostructures/ $r Maria Grazia Proietti, Johann Coraux, and Hubert Renevier -- $t The role of photoemission spectroscopies in heterojunction research / $r Giorgio Margaritondo -- $t ESR of interfaces and nanolayers in semiconductor heterostructures/ $r Andre Stesmans and Valery V. Afanas�ev.
533 $a Electronic reproduction. $b Amsterdam : $c Elsevier Science & Technology, $d 2008. $n Mode of access: World Wide Web. $n System requirements: Web browser. $n Title from title screen (viewed on Nov. 14, 2008). $n Access may be restricted to users at subscribing institutions.
650 0 $a Heterostructures. $3 714845
650 0 $a Nanostructures. $3 526234
650 0 $a Semiconductors. $3 516162
655 7 $a Electronic books. $2 lcsh $3 542853
700 1 $a Lamberti, Carlo. $3 940607
710 2 $a ScienceDirect (Online service) $3 848416
856 4 0 $3 ScienceDirect $u http://www.sciencedirect.com/science/book/9780444530998 $z An electronic book accessible through the World Wide Web; click for information
994 $a C0 $b TEF