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Precision Landmark Location for Mach...

Armstrong, Brian S.R.

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Precision Landmark Location for Machine Vision and Photogrammetry = Finding and Achieving the Maximum Possible Accuracy /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Precision Landmark Location for Machine Vision and Photogrammetry/ by Jose A. Gutierrez, Brian S.R. Armstrong.
其他題名:	Finding and Achieving the Maximum Possible Accuracy /
作者:	Gutierrez, Jose A.
其他作者:	Armstrong, Brian S.R.
出版者:	London :Springer-Verlag, : 2008.,
面頁冊數:	xi, 162 p. :ill. (some), digital ;24 cm.
Contained By:	Springer e-books
標題:	Computer vision. -
電子資源:	http://dx.doi.org/10.1007/978-1-84628-913-2http://dx.doi.org/10.1007/978-1-84628-913-2
ISBN:	9781846289125 (paper)

Precision Landmark Location for Machine Vision and Photogrammetry = Finding and Achieving the Maximum Possible Accuracy /
Gutierrez, Jose A.

Precision Landmark Location for Machine Vision and PhotogrammetryFinding and Achieving the Maximum Possible Accuracy /[electronic resource] :by Jose A. Gutierrez, Brian S.R. Armstrong. - London :Springer-Verlag,2008. - xi, 162 p. :ill. (some), digital ;24 cm.

ISBN: 9781846289125 (paper)Subjects--Topical Terms:

540671
Computer vision.

LC Class. No.: TA1634 / .G88 2008

Dewey Class. No.: 006.37

Precision Landmark Location for Machine Vision and Photogrammetry = Finding and Achieving the Maximum Possible Accuracy /
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