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CCD Image Sensors in Deep-Ultraviole...

Nathan, Arokia.

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CCD Image Sensors in Deep-Ultraviolet = Degradation Behavior and Damage Mechanisms /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	CCD Image Sensors in Deep-Ultraviolet/ by Flora M. Li, Arokia Nathan.
其他題名:	Degradation Behavior and Damage Mechanisms /
作者:	Li, Flora M..
其他作者:	Nathan, Arokia.
出版者:	Berlin, Heidelberg :Springer-Verlag Berlin Heidelberg, : 2005.,
面頁冊數:	xi, 231 p. :ill., digital ;25 cm.
叢書名:	Microtechnology and Mems,
Contained By:	Springer e-books
標題:	Charge coupled devices. -
電子資源:	http://dx.doi.org/10.1007/b139047http://dx.doi.org/10.1007/b139047
ISBN:	9783540226802 (paper)

CCD Image Sensors in Deep-Ultraviolet = Degradation Behavior and Damage Mechanisms /
Li, Flora M..

CCD Image Sensors in Deep-UltravioletDegradation Behavior and Damage Mechanisms /[electronic resource] :by Flora M. Li, Arokia Nathan. - Berlin, Heidelberg :Springer-Verlag Berlin Heidelberg,2005. - xi, 231 p. :ill., digital ;25 cm. - Microtechnology and Mems,1615-8326.

ISBN: 9783540226802 (paper)Subjects--Topical Terms:

710728
Charge coupled devices.

LC Class. No.: TA1637 / .L42 2005

Dewey Class. No.: 621.364

CCD Image Sensors in Deep-Ultraviolet = Degradation Behavior and Damage Mechanisms /
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