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Pattern Recognition and Image Analys...
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Marques, Jorge S.
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Pattern Recognition and Image Analysis = Second Iberian Conference, IbPRIA 2005, Estoril, Portugal, June 7-9, 2005, Proceedings.. I /
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Pattern Recognition and Image Analysis/ edited by Jorge S. Marques, N. Perez de la Blanca, Pedro Pina.
Reminder of title:
Second Iberian Conference, IbPRIA 2005, Estoril, Portugal, June 7-9, 2005, Proceedings.
other author:
Marques, Jorge S.
corporate name:
IbPRIA 2005
Published:
Berlin Heidelberg :Springer-Verlag GmbH., : 2005.,
Description:
1 v. :ill., digital ;24 cm.
Series:
Lecture Notes in Computer Science,
Contained By:
Springer e-books
Subject:
Computer vision - Congresses. -
Online resource:
http://dx.doi.org/10.1007/b136825http://dx.doi.org/10.1007/b136825
ISBN:
9783540261537 (paper)
Pattern Recognition and Image Analysis = Second Iberian Conference, IbPRIA 2005, Estoril, Portugal, June 7-9, 2005, Proceedings.. I /
Pattern Recognition and Image Analysis
Second Iberian Conference, IbPRIA 2005, Estoril, Portugal, June 7-9, 2005, Proceedings.I /[electronic resource] :edited by Jorge S. Marques, N. Perez de la Blanca, Pedro Pina. - Berlin Heidelberg :Springer-Verlag GmbH.,2005. - 1 v. :ill., digital ;24 cm. - Lecture Notes in Computer Science,35220302-9743 ;.
ISBN: 9783540261537 (paper)Subjects--Topical Terms:
570734
Computer vision
--Congresses.
Dewey Class. No.: 621.3848
Pattern Recognition and Image Analysis = Second Iberian Conference, IbPRIA 2005, Estoril, Portugal, June 7-9, 2005, Proceedings.. I /
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edited by Jorge S. Marques, N. Perez de la Blanca, Pedro Pina.
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Computer Science (Springer-11645; ZDB-2-SCS)
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Items
1 records • Pages 1 •
1
Inventory Number
Location Name
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Opac note
Attachments
W9044053
電子資源
11.線上閱覽_V
電子書
EB
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1 records • Pages 1 •
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