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Semiconductor material and device ch...
~
Schroder, Dieter K.
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Semiconductor material and device characterization /
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Semiconductor material and device characterization // Dieter K. Schroder.
Author:
Schroder, Dieter K.
Published:
[Piscataway, NJ] :IEEE Press ; : c2006.,
Description:
xv, 779 p. :ill. ;25 cm.
Notes:
"Wiley-Interscience."
Subject:
Semiconductors - Testing. -
Online resource:
http://www.loc.gov/catdir/enhancements/fy0645/2005048514-t.htmlhttp://www.loc.gov/catdir/enhancements/fy0645/2005048514-t.html
Online resource:
http://www.loc.gov/catdir/enhancements/fy0645/2005048514-d.htmlhttp://www.loc.gov/catdir/enhancements/fy0645/2005048514-d.html
ISBN:
0471739065 (acid-free paper)
Semiconductor material and device characterization /
Schroder, Dieter K.
Semiconductor material and device characterization /
Dieter K. Schroder. - 3rd ed. - [Piscataway, NJ] :IEEE Press ;c2006. - xv, 779 p. :ill. ;25 cm.
"Wiley-Interscience."
Includes bibliographical references and index.
ISBN: 0471739065 (acid-free paper)
LCCN: 2005048514
Nat. Bib. No.: GBA573304bnb
Nat. Bib. Agency Control No.: 013282982UkSubjects--Topical Terms:
699774
Semiconductors
--Testing.
LC Class. No.: QC611 / .S335 2006
Dewey Class. No.: 621.3815/2
Semiconductor material and device characterization /
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Dieter K. Schroder.
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3rd ed.
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[Piscataway, NJ] :
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c2006.
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IEEE Press ;
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Wiley,
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xv, 779 p. :
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ill. ;
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25 cm.
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"Wiley-Interscience."
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Includes bibliographical references and index.
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Semiconductors
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Testing.
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http://www.loc.gov/catdir/enhancements/fy0645/2005048514-t.html
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六樓西文書區HC-Z(6F Western Language Books)
Year:
Volume Number:
Items
1 records • Pages 1 •
1
Inventory Number
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Item Class
Material type
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No. of reservations
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Attachments
W0054610
六樓西文書區HC-Z(6F Western Language Books)
01.外借(書)_YB
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QC611 S335 2006
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1 records • Pages 1 •
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