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Digital systems testing and testable...

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Breuer, Melvin A.

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Digital systems testing and testable design /

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Digital systems testing and testable design // Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.
Author:	Abramovici, Miron.
other author:	Breuer, Melvin A.
Published:	New York :IEEE Press, : [1994], c1990.,
Description:	xviii, 652 p. :ill. ;27 cm.
Subject:	Digital integrated circuits - Design and construction. -
Online resource:	http://www.loc.gov/catdir/toc/onix07/94233953.htmlhttp://www.loc.gov/catdir/toc/onix07/94233953.html
Online resource:	http://www.loc.gov/catdir/bios/wiley045/94233953.htmlhttp://www.loc.gov/catdir/bios/wiley045/94233953.html
Online resource:	http://www.loc.gov/catdir/description/wiley039/94233953.htmlhttp://www.loc.gov/catdir/description/wiley039/94233953.html
ISBN:	0780310624 (hbk.) :

Digital systems testing and testable design /
Abramovici, Miron.

Digital systems testing and testable design /Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman. - Rev. print. - New York :IEEE Press,[1994], c1990. - xviii, 652 p. :ill. ;27 cm.

Includes bibliographical references and index.

ISBN: 0780310624 (hbk.) :US89.95

LCCN: 94233953Subjects--Topical Terms:

649266
Digital integrated circuits
--Design and construction.

LC Class. No.: TK7874 / .A23 1990b

Digital systems testing and testable design /
LDR:01030pam a2200205 a 45 001 699667
005 20060112
008 060112t19941990nyua b 001 0 eng
010 $a 94233953
020 $a 0780310624 (hbk.) : $c US89.95
035 $a CE94T0056
040 $a DLC $c DLC $d DLC
050 0 0 $a TK7874 $b .A23 1990b
100 $a Abramovici, Miron. $3 752833
245 1 0 $a Digital systems testing and testable design / $c Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.
250 $a Rev. print.
260 $a New York : $c [1994], c1990. $b IEEE Press,
300 $a xviii, 652 p. : $b ill. ; $c 27 cm.
504 $a Includes bibliographical references and index.
650 $a Digital integrated circuits $x Design and construction. $3 649266
650 $a Digital integrated circuits $x Testing. $3 752574
700 $a Breuer, Melvin A. $3 752831
700 $a Friedman, Arthur D. $3 752832
856 4 $3 Table of Contents $u http://www.loc.gov/catdir/toc/onix07/94233953.html $z http://www.loc.gov/catdir/toc/onix07/94233953.html
856 4 2 $3 Contributor biographical information $u http://www.loc.gov/catdir/bios/wiley045/94233953.html $z http://www.loc.gov/catdir/bios/wiley045/94233953.html
856 4 2 $3 Publisher description $u http://www.loc.gov/catdir/description/wiley039/94233953.html $z http://www.loc.gov/catdir/description/wiley039/94233953.html

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Location: Year: Volume Number:

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1 records • Pages 1 •
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Inventory Number

No. of reservations

W0051123

六樓西文書區HC-Z(6F Western Language Books)

01.外借(書)_YB

一般圖書

TK7874 A23 1994

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1 records • Pages 1 •
1

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