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Digital systems testing and testable...
~
Breuer, Melvin A.
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Digital systems testing and testable design /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
Digital systems testing and testable design // Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.
作者:
Abramovici, Miron.
其他作者:
Breuer, Melvin A.
出版者:
New York :IEEE Press, : [1994], c1990.,
面頁冊數:
xviii, 652 p. :ill. ;27 cm.
標題:
Digital integrated circuits - Design and construction. -
電子資源:
http://www.loc.gov/catdir/toc/onix07/94233953.htmlhttp://www.loc.gov/catdir/toc/onix07/94233953.html
電子資源:
http://www.loc.gov/catdir/bios/wiley045/94233953.htmlhttp://www.loc.gov/catdir/bios/wiley045/94233953.html
電子資源:
http://www.loc.gov/catdir/description/wiley039/94233953.htmlhttp://www.loc.gov/catdir/description/wiley039/94233953.html
ISBN:
0780310624 (hbk.) :
Digital systems testing and testable design /
Abramovici, Miron.
Digital systems testing and testable design /
Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman. - Rev. print. - New York :IEEE Press,[1994], c1990. - xviii, 652 p. :ill. ;27 cm.
Includes bibliographical references and index.
ISBN: 0780310624 (hbk.) :US89.95
LCCN: 94233953Subjects--Topical Terms:
649266
Digital integrated circuits
--Design and construction.
LC Class. No.: TK7874 / .A23 1990b
Digital systems testing and testable design /
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