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A guide to materials characterizatio...

Sibilia, John P.

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A guide to materials characterization and chemical analysis /

Record Type:	Language materials, printed : Monograph/item
Title/Author:	A guide to materials characterization and chemical analysis // edited by John P. Sibilia.
other author:	Sibilia, John P.
Published:	New York :VCH, : c1996.,
Description:	xii, 388 p. :ill. ;24 cm.
[NT 15003449]:	An introduction to materials characterization and chemical analysis / John P. Sibilia -- Molecular spectroscopy / Robert G. Bray and John P. Sibilia -- Magnetic resonance spectroscpy / Sean A. Curran and Raymond Brambilla -- Mass spectrometry/ R. Donald Sedgewick and David M. Hindenlang -- Seperation techniques / Mina K. Gabriel ... [et al.] -- Elemental and chemical analysis / Richard J. Williams and Daniel E. Bause -- X-ray analysis / N. Sanjeeva Murthy and Franz Reidinger -- Microscopy/ John E. Macur, Jordi Marti, and Siu-Ching Lui -- Image analysis / Siu-Ching Lui -- Surface analysis / Edgar A. Leone and Anthony J. Signorelli -- Thermal characterization of materials / Yash P. Khanna -- Rheology and molecular weight of polymers/ Yash P. Khanna, Milton E. McDonnell and Peter K. Han -- Physical properties of particles and polymers / Milton E. McDonnell and Karl Zero -- Applied mechanics and physical testing / Igor Palley and Nanying Jia -- Scientific computation/ Willis B. Hammond and Jon M. Peltier.
Subject:	Chemistry, Analytic. -
ISBN:	0471186333 :

A guide to materials characterization and chemical analysis /
A guide to materials characterization and chemical analysis /edited by John P. Sibilia. - 2nd ed. - New York :VCH,c1996. - xii, 388 p. :ill. ;24 cm.

Includes bibliographical references and index.

An introduction to materials characterization and chemical analysis / John P. Sibilia -- Molecular spectroscopy / Robert G. Bray and John P. Sibilia -- Magnetic resonance spectroscpy / Sean A. Curran and Raymond Brambilla -- Mass spectrometry/ R. Donald Sedgewick and David M. Hindenlang -- Seperation techniques / Mina K. Gabriel ... [et al.] -- Elemental and chemical analysis / Richard J. Williams and Daniel E. Bause -- X-ray analysis / N. Sanjeeva Murthy and Franz Reidinger -- Microscopy/ John E. Macur, Jordi Marti, and Siu-Ching Lui -- Image analysis / Siu-Ching Lui -- Surface analysis / Edgar A. Leone and Anthony J. Signorelli -- Thermal characterization of materials / Yash P. Khanna -- Rheology and molecular weight of polymers/ Yash P. Khanna, Milton E. McDonnell and Peter K. Han -- Physical properties of particles and polymers / Milton E. McDonnell and Karl Zero -- Applied mechanics and physical testing / Igor Palley and Nanying Jia -- Scientific computation/ Willis B. Hammond and Jon M. Peltier.

ISBN: 0471186333 :US104.95

LCCN: 96001306 //r98Subjects--Topical Terms:

517805
Chemistry, Analytic.
Subjects--Index Terms:

Chemical analysis.

LC Class. No.: QD75.2 / .G83 1996

Dewey Class. No.: 543

A guide to materials characterization and chemical analysis /
LDR:01658pam a2200217 a 45 001 690063
003 aOCoLC
005 20031001
008 031001s1996 nyua b 001 0 eng
010 $a 96001306 //r98
020 $a 0471186333 : $c US104.95
035 $a CS92T0057
040 $a DLC $c DLC $d PMC $d UKM $d DH
050 4 $a QD75.2 $b .G83 1996
082 0 0 $a 543 $2 20
245 0 2 $a A guide to materials characterization and chemical analysis / $c edited by John P. Sibilia.
250 $a 2nd ed.
260 $a New York : $c c1996. $b VCH,
300 $a xii, 388 p. : $b ill. ; $c 24 cm.
504 $a Includes bibliographical references and index.
505 0 $a An introduction to materials characterization and chemical analysis / John P. Sibilia -- Molecular spectroscopy / Robert G. Bray and John P. Sibilia -- Magnetic resonance spectroscpy / Sean A. Curran and Raymond Brambilla -- Mass spectrometry/ R. Donald Sedgewick and David M. Hindenlang -- Seperation techniques / Mina K. Gabriel ... [et al.] -- Elemental and chemical analysis / Richard J. Williams and Daniel E. Bause -- X-ray analysis / N. Sanjeeva Murthy and Franz Reidinger -- Microscopy/ John E. Macur, Jordi Marti, and Siu-Ching Lui -- Image analysis / Siu-Ching Lui -- Surface analysis / Edgar A. Leone and Anthony J. Signorelli -- Thermal characterization of materials / Yash P. Khanna -- Rheology and molecular weight of polymers/ Yash P. Khanna, Milton E. McDonnell and Peter K. Han -- Physical properties of particles and polymers / Milton E. McDonnell and Karl Zero -- Applied mechanics and physical testing / Igor Palley and Nanying Jia -- Scientific computation/ Willis B. Hammond and Jon M. Peltier.
650 $a Chemistry, Analytic. $3 517805
650 $a Materials $x Testing. $3 601009
653 0 $a Chemical analysis.
700 $a Sibilia, John P. $3 685989