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Surface analysis with STM and AFM : ...

Whangbo, Myung-Hwan.

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Surface analysis with STM and AFM : = experimental and theoretical aspects of image analysis /

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Surface analysis with STM and AFM :/ Sergei N. Magonov, Myung-Hwan Whangbo.
Reminder of title:	experimental and theoretical aspects of image analysis /
Author:	Magonov, Sergei N.
other author:	Whangbo, Myung-Hwan.
Published:	Weinheim ;VCH, : c1996.,
Description:	xii, 323 p. :ill. ;25 cm.
Subject:	Atomic force microscopy. -
ISBN:	3527293132 :

Surface analysis with STM and AFM : = experimental and theoretical aspects of image analysis /
Magonov, Sergei N.

Surface analysis with STM and AFM :experimental and theoretical aspects of image analysis /Sergei N. Magonov, Myung-Hwan Whangbo. - Weinheim ;VCH,c1996. - xii, 323 p. :ill. ;25 cm.

Includes bibliographical references and index.

ISBN: 3527293132 :US153.80Subjects--Topical Terms:

587940
Atomic force microscopy.

Surface analysis with STM and AFM : = experimental and theoretical aspects of image analysis /
LDR:00540nam a2200145 a 45 001 676870
003 aOCoLC
005 20000501142349.2
008 000428s1996 gw a b 001 0 eng d
020 $a 3527293132 : $c US153.80
035 $a psw89000047
040 $a CWR $c CWR $d PBR $d AGL $d DH
100 $a Magonov, Sergei N. $3 714671
245 1 0 $a Surface analysis with STM and AFM : $b experimental and theoretical aspects of image analysis / $c Sergei N. Magonov, Myung-Hwan Whangbo.
260 $a Weinheim ; $a New York : $c c1996. $b VCH,
300 $a xii, 323 p. : $b ill. ; $c 25 cm.
504 $a Includes bibliographical references and index.
650 $a Atomic force microscopy. $3 587940
650 $a Electric insulators and insulation $x Testing. $3 714672
650 $a Metals $x Surfaces $x Analysis. $3 714673
650 $a Scanning tunneling microscopy. $3 587941
650 $a Semiconductors $x Testing. $3 699774
650 $a Surfaces (Technology) $x Analysis. $3 592671
700 $a Whangbo, Myung-Hwan. $3 714670