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14th IEEE VLSI Test Symposium : = Ap...

IEEE Computer Society., Test Technology Technical Committee.

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14th IEEE VLSI Test Symposium : = April 28-May 1, 1996, Princeton, New Jersey : proceedings /

Record Type:	Language materials, printed : Monograph/item
Title/Author:	14th IEEE VLSI Test Symposium :/ sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section.
Reminder of title:	April 28-May 1, 1996, Princeton, New Jersey : proceedings /
remainder title:	Fourteenth IEEE VLSI Test Symposium
corporate name:	IEEE VLSI Test Symposium
Published:	Los Alamitos, Calif. :IEEE Computer Society Press, : c1996.,
Description:	xxix, 510 p. :ill. ;28 cm.
Notes:	"IEEE Computer Society Press order number PR07304"--T.p. verso.
Subject:	Integrated circuits - Very large scale integration -
ISBN:	0818673044 (pbk.) :

14th IEEE VLSI Test Symposium : = April 28-May 1, 1996, Princeton, New Jersey : proceedings /
14th IEEE VLSI Test Symposium :April 28-May 1, 1996, Princeton, New Jersey : proceedings /Fourteenth IEEE VLSI Test Symposiumsponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section. - Los Alamitos, Calif. :IEEE Computer Society Press,c1996. - xxix, 510 p. :ill. ;28 cm.

"IEEE Computer Society Press order number PR07304"--T.p. verso.

Includes bibliographical references and index.

ISBN: 0818673044 (pbk.) :US100.00

LCCN: 96075502Subjects--Topical Terms:

699885
Integrated circuits
--Very large scale integration

LC Class. No.: TK7874 / .I3274 1996

Dewey Class. No.: 621.39/5/0287

14th IEEE VLSI Test Symposium : = April 28-May 1, 1996, Princeton, New Jersey : proceedings /
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020 $a 0818673060 (microfiche)
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111 $a IEEE VLSI Test Symposium $n (14th : $d 1996 : $c Princeton, N.J.) $3 699884
245 1 0 $a 14th IEEE VLSI Test Symposium : $b April 28-May 1, 1996, Princeton, New Jersey : proceedings / $c sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section.
246 3 $a Fourteenth IEEE VLSI Test Symposium
260 $a Los Alamitos, Calif. : $c c1996. $b IEEE Computer Society Press,
300 $a xxix, 510 p. : $b ill. ; $c 28 cm.
500 $a "IEEE Computer Society Press order number PR07304"--T.p. verso.
500 $a "IEEE Order Plan number 96TB100043"--T.p. verso.
504 $a Includes bibliographical references and index.
650 $a Integrated circuits $x Very large scale integration $x Testing $x Congresses. $3 699885
710 $a IEEE Computer Society. $b Test Technology Technical Committee. $3 659597
710 $a Institution of Electrical and Electronics Engineers. $b Philadelphia Section. $3 699883
740 0 $a Proceedings : 14th IEEE VLSI Test Symposium.