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Proceedings : = International Test C...
~
IEEE Computer Society., Test Technology Technical Committee.
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Proceedings : = International Test Conference 1994 /
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Proceedings :/ [sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section].
Reminder of title:
International Test Conference 1994 /
corporate name:
International Test Conference
Published:
Altoona, PA :The Conference ; : c1994,
Description:
xi, 1033 p. :ill. ;28 cm.
Notes:
"IEEE catalog number 94CH34835, IEEE Computer Society Press order number 6802-02"--T.p. verso.
Subject:
Electronic digital computers - Circuits -
ISBN:
0780321022 (softbound)
Proceedings : = International Test Conference 1994 /
Proceedings :
International Test Conference 1994 /[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section]. - Altoona, PA :The Conference ;c1994 - xi, 1033 p. :ill. ;28 cm.
"IEEE catalog number 94CH34835, IEEE Computer Society Press order number 6802-02"--T.p. verso.
Includes bibliographical references and index.
ISBN: 0780321022 (softbound)
LCCN: 94078172Subjects--Topical Terms:
695883
Electronic digital computers
--Circuits
LC Class. No.: TK7874 / .I593 1994
Proceedings : = International Test Conference 1994 /
LDR
:01064nam a2200253 a 45
001
666582
003
OCoLC
005
19990917135202.9
008
941021s1994 paua b 001 0 eng d
010
$a
94078172
020
$a
0780321022 (softbound)
020
$a
0780321030 (casebound) :
$c
US134.00
020
$a
0780321049 (microfiche)
035
$a
dt 00015202
040
$a
RBL
$c
RBL
050
$a
TK7874
$b
.I593 1994
111
$a
International Test Conference
$n
(25th :
$d
1994 :
$c
Washington D.C)
$3
695882
245
1 0
$a
Proceedings :
$b
International Test Conference 1994 /
$c
[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section].
260
$a
Altoona, PA :
$a
Piscataway, N.J. :
$c
c1994
$b
The Conference ;
$b
additional copies can be ordered from IEEE Service Center,
300
$a
xi, 1033 p. :
$b
ill. ;
$c
28 cm.
500
$a
"IEEE catalog number 94CH34835, IEEE Computer Society Press order number 6802-02"--T.p. verso.
500
$a
Cover title: Test : the next 25 years.
500
$a
Spine title: International Test Conference 1994 : proceedings.
504
$a
Includes bibliographical references and index.
650
$a
Electronic digital computers
$x
Circuits
$x
Testing
$x
Congresses.
$3
695883
650
$a
Integrated circuits
$x
Testing
$x
Congresses.
$3
659601
650
$a
TEST: The Next 25 Years
$3
695884
710
$a
IEEE Computer Society.
$b
Test Technology Technical Committee.
$3
659597
710
$a
Institute of Electrical and Electronics Engineers.
$3
595741
740
0 1
$a
International Test Conference 1994 : proceedings.
740
0 1
$a
Test : the next 25 years.
based on 0 review(s)
Location:
ALL
罕用書庫221室(美崙校區,調書請點預約)(RU_221)
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Volume Number:
Items
1 records • Pages 1 •
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Attachments
W0027384
罕用書庫221室(美崙校區,調書請點預約)(RU_221)
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TK7874 I593 1994
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1 records • Pages 1 •
1
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