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Proceedings : = International Test C...

IEEE Computer Society., Test Technology Technical Committee.

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Proceedings : = International Test Conference 1992 /

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Proceedings :/ [sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section].
Reminder of title:	International Test Conference 1992 /
corporate name:	International Test Conference
Published:	Altoona, PA :The Conference ; : c1992.,
Description:	xii, 1012 p. :ill. ;28 cm.
Notes:	"IEEE catalog number 92-CH3191-4"--P. ii.
Subject:	Automatic checkout equipment - Congresses. -
ISBN:	0780307607 (casebound) :

Proceedings : = International Test Conference 1992 /
Proceedings :International Test Conference 1992 /[sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section]. - Altoona, PA :The Conference ;c1992. - xii, 1012 p. :ill. ;28 cm.

"IEEE catalog number 92-CH3191-4"--P. ii.

Includes bibliographical refrences and index.

ISBN: 0780307607 (casebound) :US128.00

LCCN: 92073585Subjects--Topical Terms:

678617
Automatic checkout equipment
--Congresses.

LC Class. No.: TK7874 / .I474 1992

Dewey Class. No.: 621.3815/028/7

Proceedings : = International Test Conference 1992 /
LDR:01278nam a2200277 a 45 001 656950
003 DLC
005 19990917133707.8
008 920910s1992 paua b 101 0 eng
010 $a 92073585
020 $a 0780307607 (casebound) : $c US128.00
020 $a 081863166X (microfiche)
020 $a 0818631678 (softbound)
035 $a dt 00020341
040 $a DLC $c DLC
050 0 0 $a TK7874 $b .I474 1992
082 0 0 $a 621.3815/028/7 $2 20
111 $a International Test Conference $n (23th : $d 1992 : $c Baltimore, Md.) $3 678616
245 1 0 $a Proceedings : $b International Test Conference 1992 / $c [sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section].
260 $a Altoona, PA : $a Piscataway, NJ : $c c1992. $b The Conference ; $b Can be ordered from IEEE Service Center,
300 $a xii, 1012 p. : $b ill. ; $c 28 cm.
500 $a "IEEE catalog number 92-CH3191-4"--P. ii.
500 $a "IEEE Computer Society Press order number 3167"--P. ii.
500 $a Cover title: Discover the new world of test and design : September 20-24, 1992, Convention Center, Baltimore, MD, USA.
500 $a Spine title: International Test Conference 1992 : proceedings.
504 $a Includes bibliographical refrences and index.
650 $a Automatic checkout equipment $x Congresses. $3 678617
650 $a Integrated circuits $x Testing $x Congresses. $3 659601
710 $a IEEE Computer Society. $b Test Technology Technical Committee. $3 659597
710 $a Institute of Electrical and Electronics Engineers. $b Philadelphia Section. $3 659598
740 0 $a Discover the new world of test and design : September 20-24, 1992, Convention Center, Baltimore, MD, USA
740 0 $a International Test Conference 1992 : proceedings.