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Statistical analysis of geographic i...
~
Lee, Jay.
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Statistical analysis of geographic information with ArcView GIS and ArcGIS /
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Statistical analysis of geographic information with ArcView GIS and ArcGIS // David W.S. Wong, Jay Lee.
Author:
Wong, David W. S.
other author:
Lee, Jay.
Published:
Hoboken, N.J. :John Wiley & Sons, Inc., : c2005.,
Description:
xvii, 441 p. :ill., maps ;25 cm. +1 CD-ROM (4 3/4 in.)
Notes:
Rev. ed. of: Statistical analysis with ArcView GIS / Jay Lee, David W.S. Wong. 2001.
Subject:
Geographic information systems. -
Online resource:
http://www.loc.gov/catdir/toc/ecip058/2005005178.htmlhttp://www.loc.gov/catdir/toc/ecip058/2005005178.html
ISBN:
0471468991$b(hbk.)
Statistical analysis of geographic information with ArcView GIS and ArcGIS /
Wong, David W. S.
Statistical analysis of geographic information with ArcView GIS and ArcGIS /
David W.S. Wong, Jay Lee. - Fully rev. & updated. - Hoboken, N.J. :John Wiley & Sons, Inc.,c2005. - xvii, 441 p. :ill., maps ;25 cm. +1 CD-ROM (4 3/4 in.)
Rev. ed. of: Statistical analysis with ArcView GIS / Jay Lee, David W.S. Wong. 2001.
Includes bibliographical references and index.
ISBN: 0471468991$b(hbk.)NT$3245
LCCN: 2005005178
Nat. Bib. No.: GBA573251bnbSubjects--Uniform Titles:
ArcView.
Subjects--Topical Terms:
542758
Geographic information systems.
LC Class. No.: G70.212 / .L43 2005
Dewey Class. No.: 910/.285
Statistical analysis of geographic information with ArcView GIS and ArcGIS /
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David W.S. Wong, Jay Lee.
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c2005.
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John Wiley & Sons, Inc.,
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ill., maps ;
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Rev. ed. of: Statistical analysis with ArcView GIS / Jay Lee, David W.S. Wong. 2001.
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http://www.loc.gov/catdir/toc/ecip058/2005005178.html
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http://www.loc.gov/catdir/toc/ecip058/2005005178.html
based on 0 review(s)
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五樓西文書區A-HB(5F Western Language Books)
Year:
Volume Number:
Items
1 records • Pages 1 •
1
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Attachments
F0046155
五樓西文書區A-HB(5F Western Language Books)
01.外借(書)_YB
一般圖書
G70.212 L43 2005
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1 records • Pages 1 •
1
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