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Transmission electron microscopy and...

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Howe, James M., (1955-)

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Transmission electron microscopy and diffractometry of materials /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Transmission electron microscopy and diffractometry of materials // Brent Fultz, James Howe.
作者:	Fultz, B.
其他作者:	Howe, James M.,
出版者:	Berlin ;Springer, : c2002.,
面頁冊數:	xxi, 748 p. :ill. ;24 cm.
標題:	Materials - Microscopy. -
ISBN:	3540437649$b(hbk.)

Transmission electron microscopy and diffractometry of materials /
Fultz, B.

Transmission electron microscopy and diffractometry of materials /Brent Fultz, James Howe. - 2nd ed. - Berlin ;Springer,c2002. - xxi, 748 p. :ill. ;24 cm.

Includes bibliographical references and index.

ISBN: 3540437649$b(hbk.)NT$3272

LCCN: 2002070720Subjects--Topical Terms:

559323
Materials
--Microscopy.

LC Class. No.: TA417.23 / .F85 2002

Dewey Class. No.: 620.1/1299

Transmission electron microscopy and diffractometry of materials /
LDR:00610nam 2200193 a 450 001 601670
005 19970923105442.0
008 030922s2002 gw a b 001 0 eng
010 $a 2002070720
020 $a 3540437649$b(hbk.) $c NT$3272
035 $a 00262389
040 $a DLC $c DLC $d DLC
042 $a pcc
050 0 0 $a TA417.23 $b .F85 2002
082 0 0 $a 620.1/1299 $2 21
100 $a Fultz, B. $q (Brent) $3 571556
245 1 0 $a Transmission electron microscopy and diffractometry of materials / $c Brent Fultz, James Howe.
250 $a 2nd ed.
260 $a Berlin ; $a New York : $c c2002. $b Springer,
300 $a xxi, 748 p. : $b ill. ; $c 24 cm.
504 $a Includes bibliographical references and index.
650 $a Materials $x Microscopy. $3 559323
650 $a Transmission electron microscopy. $3 567074
650 $a X-ray diffractometer. $3 571557
700 $a Howe, James M., $d 1955- $3 571555

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TA417.23 F85 2002

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