| Record Type: |
Electronic resources
: Monograph/item
|
| Title/Author: |
Reliability of CMOS analog ICs/ by Hakan Kuntman ... [et al.]. |
| other author: |
Kuntman, Hakan. |
| Published: |
Cham :Springer Nature Switzerland : : 2025., |
| Description: |
xii, 94 p. :ill. (some col.), digital ;24 cm. |
| [NT 15003449]: |
Introduction -- The reliability model for PMOS and NMOS transistors based on statistical methods -- Demonstration of Proposed Method with Application Examples -- On the degradation of OTA-C-based CMOS low-power filter circuits for biomedical instrumentation -- Power MOSFET degradation and statistical investigation of the degradation effect on DC-DC converters and converter parameters. |
| Contained By: |
Springer Nature eBook |
| Subject: |
Analog CMOS integrated circuits. - |
| Online resource: |
https://doi.org/10.1007/978-3-031-85455-2 |
| ISBN: |
9783031854552 |