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The BaSIC topology = a revolutionary...
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Baliga, B. Jayant.
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The BaSIC topology = a revolutionary power device control strategy /
紀錄類型:
書目-電子資源 : Monograph/item
正題名/作者:
The BaSIC topology/ by B. Jayant Baliga, Ajit Kanale.
其他題名:
a revolutionary power device control strategy /
作者:
Baliga, B. Jayant.
其他作者:
Kanale, Ajit.
出版者:
Cham :Springer Nature Switzerland : : 2025.,
面頁冊數:
xxii, 316 p. :ill. (chiefly color), digital ;24 cm.
內容註:
Introduction -- Short-circuit withstand capability -- Conventional current sensing in devices -- The BaSIC topology concept -- Application of the BaSIC Topology to Si IGBTs -- Application of the BaSIC Topology to SiC Power MOSFETs -- Application of the BaSIC Topology to GaN HEMT devices -- Current Sensing using the BaSIC Topology -- Eliminating repetitive short-circuit failure using the BaSIC Topology -- Avalanche ruggedness of the BaSIC Topology to GaN HEMT devices -- Optimization of Silicon Depletion-Mode MOSFETs for the BaSIC Topology -- Selection Methodology for Silicon Enhancement-Mode MOSFETs for the BaSIC Topology -- Comparison of the BaSIC Topology to the conventional DESAT topology -- Synopsys.
Contained By:
Springer Nature eBook
標題:
Power semiconductors. -
電子資源:
https://doi.org/10.1007/978-3-031-86630-2
ISBN:
9783031866302
The BaSIC topology = a revolutionary power device control strategy /
Baliga, B. Jayant.
The BaSIC topology
a revolutionary power device control strategy /[electronic resource] :by B. Jayant Baliga, Ajit Kanale. - Cham :Springer Nature Switzerland :2025. - xxii, 316 p. :ill. (chiefly color), digital ;24 cm.
Introduction -- Short-circuit withstand capability -- Conventional current sensing in devices -- The BaSIC topology concept -- Application of the BaSIC Topology to Si IGBTs -- Application of the BaSIC Topology to SiC Power MOSFETs -- Application of the BaSIC Topology to GaN HEMT devices -- Current Sensing using the BaSIC Topology -- Eliminating repetitive short-circuit failure using the BaSIC Topology -- Avalanche ruggedness of the BaSIC Topology to GaN HEMT devices -- Optimization of Silicon Depletion-Mode MOSFETs for the BaSIC Topology -- Selection Methodology for Silicon Enhancement-Mode MOSFETs for the BaSIC Topology -- Comparison of the BaSIC Topology to the conventional DESAT topology -- Synopsys.
The BaSIC topology is a revolutionary method for controlling power semiconductor devices. It enables monitoring the current flow through the devices while providing a unique current limiting capability that enhances their short-circuit withstand capability. The book describes the BaSIC topology concept and contrasts it with previous approaches. It provides an extensive description of the application of the BaSIC topology to silicon IGBTs, silicon carbide power MOSFETs, and GaN HEMT devices. The ability to extend the short-circuit withstand time to over 10 ms for SiC power MOSFETs has been achieved for the first time with the BaSIC topology. The BaSIC topology is the only approach shown to eliminate the failure of these devices under repetitive short-circuit events. The sensing of current in paralleled devices is demonstrated, eliminating the need for external sensors. The BaSIC topology has utility for various power electronics applications, including electric vehicles and industrial motor drives. Introduces the BaSIC topology - a revolutionary new approach for the control of power devices; Describes the application of the BaSIC topology to silicon IGBTs, silicon carbide power MOSFETs, and GaN HEMT devices; Written by the inventor of the insulated-gate bipolar transistor (IGBT) and the BaSIC topology concept.
ISBN: 9783031866302
Standard No.: 10.1007/978-3-031-86630-2doiSubjects--Topical Terms:
1047981
Power semiconductors.
LC Class. No.: TK7871.85
Dewey Class. No.: 621.38152
The BaSIC topology = a revolutionary power device control strategy /
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Introduction -- Short-circuit withstand capability -- Conventional current sensing in devices -- The BaSIC topology concept -- Application of the BaSIC Topology to Si IGBTs -- Application of the BaSIC Topology to SiC Power MOSFETs -- Application of the BaSIC Topology to GaN HEMT devices -- Current Sensing using the BaSIC Topology -- Eliminating repetitive short-circuit failure using the BaSIC Topology -- Avalanche ruggedness of the BaSIC Topology to GaN HEMT devices -- Optimization of Silicon Depletion-Mode MOSFETs for the BaSIC Topology -- Selection Methodology for Silicon Enhancement-Mode MOSFETs for the BaSIC Topology -- Comparison of the BaSIC Topology to the conventional DESAT topology -- Synopsys.
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