東華大學圖書館 |

語系: 繁體中文

說明(常見問題)

回圖書館首頁

手機版館藏查詢

登入

回首頁

切換: 標籤 | MARC模式 | ISBD

Incremental Test Pattern Generation ...

Joe, Jerin.

FindBook

Google Book

Amazon

博客來

Incremental Test Pattern Generation for Structurally Similar Circuits.

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Incremental Test Pattern Generation for Structurally Similar Circuits./
作者:	Joe, Jerin.
出版者:	Ann Arbor : ProQuest Dissertations & Theses, : 2023,
面頁冊數:	112 p.
附註:	Source: Dissertations Abstracts International, Volume: 84-10, Section: B.
Contained By:	Dissertations Abstracts International84-10B.
標題:	Circuits. -
電子資源:	https://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=30499159
ISBN:	9798379435103

Incremental Test Pattern Generation for Structurally Similar Circuits.
Joe, Jerin.

Incremental Test Pattern Generation for Structurally Similar Circuits. - Ann Arbor : ProQuest Dissertations & Theses, 2023 - 112 p.

Source: Dissertations Abstracts International, Volume: 84-10, Section: B.

Thesis (Ph.D.)--Purdue University, 2023.

This item must not be sold to any third party vendors.

The advancement of semiconductor technology has resulted in the development of devices that are fast, cost-effective, low-power, and high-performance. Many gates are integrated into smaller areas, resulting in increased complexity of digital circuits. Increased size and complexity result in a large number of faults, which increases the time taken to test the circuit. However, as the size of the digital designs increases, they also exhibit structural similarities. This thesis describes a test generation process that utilizes structural similarity to speed up the test generation process. The property of structural similarity can be seen in circuits that are subjected to engineering change order (ECO), circuits that are modified during place and route, circuits subjected to retiming, circuits with multiple cores. The goal is to determine the testability of a circuit (circuit2) given a test set for a structurally similar circuit (circuit1). This is achieved by transforming a test set generated for circuit1 into a test set for circuit2 without repeating the entire test generation process. The algorithm starts with a structural analysis of circuit1 and circuit2 that captures their structural properties using an integer-arithmetic based computation called signatures. The signatures are used to obtain a partial mapping between the inputs and outputs of the two circuits. The mapping is used for transforming test patterns for circuit1 into test patterns for circuit2. The first chapter looks into similar circuits obtained after modifying the gate-level netlist. In the next chapter, structurally similar circuits were obtained by modifying the RTL, and the gate-level was resynthesized. This chapter proposed a mapping methodology to accommodate the changes introduced during the resynthesis of a netlist. Lastly, the thesis described a test generation methodology where transition faults are considered, which required two-cycle tests to be detected.

ISBN: 9798379435103Subjects--Topical Terms:

3555093
Circuits.
Subjects--Index Terms:

Test generation

Incremental Test Pattern Generation for Structurally Similar Circuits.
LDR:03041nmm a2200337 4500 001 2393647
005 20240414211502.5
006 m o d
007 cr#unu||||||||
008 251215s2023 ||||||||||||||||| ||eng d
020 $a 9798379435103
035 $a (MiAaPQ)AAI30499159
035 $a (MiAaPQ)Purdue22249246
035 $a AAI30499159
040 $a MiAaPQ $c MiAaPQ
100 1 $a Joe, Jerin. $3 3763118
245 1 0 $a Incremental Test Pattern Generation for Structurally Similar Circuits.
260 1 $a Ann Arbor : $b ProQuest Dissertations & Theses, $c 2023
300 $a 112 p.
500 $a Source: Dissertations Abstracts International, Volume: 84-10, Section: B.
500 $a Advisor: Pomeranz, Irith.
502 $a Thesis (Ph.D.)--Purdue University, 2023.
506 $a This item must not be sold to any third party vendors.
520 $a The advancement of semiconductor technology has resulted in the development of devices that are fast, cost-effective, low-power, and high-performance. Many gates are integrated into smaller areas, resulting in increased complexity of digital circuits. Increased size and complexity result in a large number of faults, which increases the time taken to test the circuit. However, as the size of the digital designs increases, they also exhibit structural similarities. This thesis describes a test generation process that utilizes structural similarity to speed up the test generation process. The property of structural similarity can be seen in circuits that are subjected to engineering change order (ECO), circuits that are modified during place and route, circuits subjected to retiming, circuits with multiple cores. The goal is to determine the testability of a circuit (circuit2) given a test set for a structurally similar circuit (circuit1). This is achieved by transforming a test set generated for circuit1 into a test set for circuit2 without repeating the entire test generation process. The algorithm starts with a structural analysis of circuit1 and circuit2 that captures their structural properties using an integer-arithmetic based computation called signatures. The signatures are used to obtain a partial mapping between the inputs and outputs of the two circuits. The mapping is used for transforming test patterns for circuit1 into test patterns for circuit2. The first chapter looks into similar circuits obtained after modifying the gate-level netlist. In the next chapter, structurally similar circuits were obtained by modifying the RTL, and the gate-level was resynthesized. This chapter proposed a mapping methodology to accommodate the changes introduced during the resynthesis of a netlist. Lastly, the thesis described a test generation methodology where transition faults are considered, which required two-cycle tests to be detected.
590 $a School code: 0183.
650 4 $a Circuits. $3 3555093
650 4 $a Semiconductors. $3 516162
650 4 $a Electrical engineering. $3 649834
653 $a Test generation
690 $a 0544
710 2 $a Purdue University. $3 1017663
773 0 $t Dissertations Abstracts International $g 84-10B.
790 $a 0183
791 $a Ph.D.
792 $a 2023
793 $a English
856 4 0 $u https://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=30499159