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Conductive Atomic Force Microscopy Analysis of Sub-30 nm Magnetic Tunnel Junction Nanopillars.

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Conductive Atomic Force Microscopy Analysis of Sub-30 nm Magnetic Tunnel Junction Nanopillars./
作者:	Evarts, Eric R.
面頁冊數:	1 online resource (255 pages)
附註:	Source: Dissertations Abstracts International, Volume: 74-08, Section: B.
Contained By:	Dissertations Abstracts International74-08B.
標題:	Electrical engineering. -
電子資源:	http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3536196click for full text (PQDT)
ISBN:	9781267920515

Conductive Atomic Force Microscopy Analysis of Sub-30 nm Magnetic Tunnel Junction Nanopillars.
Evarts, Eric R.

Conductive Atomic Force Microscopy Analysis of Sub-30 nm Magnetic Tunnel Junction Nanopillars. - 1 online resource (255 pages)

Source: Dissertations Abstracts International, Volume: 74-08, Section: B.

Thesis (Ph.D.)--Carnegie Mellon University, 2011.

Includes bibliographical references

At the nanoscale, physical processes can be found that do not have a macroscopic counterpart. The electrical manipulation of nanomagnets is an example of one such process that has no measurable effect in structures larger than a few micrometers. For nanomagnets less than 50 nm across, there was no existing technique that could reliably detect and manipulate these nanomagnets. I present here a conductive atomic force microscopy (CAFM) technique that can deliver greater than 10 mA of current to a magnetic nanopillar as small as 10 nm in diameter. Using magnetic tunnel junction (MTJ) nanopillars with two thin ferromagnetic layers separated by a thin insulator, two different electrical resistances are measured for the parallel and antiparallel relative magnetic orientations. Using this technique, I demonstrated spin torque transfer (STT) switching of MTJ nanopillars. Using nanoparticle masking, I fabricated smaller MTJ nanopillars than previously reported. These 26 nm diameter MTJ nanopillars showed an increased switching current density of 10 x 10 6 A/cm2 compared to the 1-3 x 106 A/cm2 observed on 200 nm x 100 nm nanopillars. As these small nanopillars were cycled multiple times, the electrical and magnetic properties changed showing a decrease in the ΔR between the two states and an overall increase in the resistance indicating a shrinking effective nanopillar diameter due to oxidation. The low frequency noise power spectrum was recorded as a function of applied current density. These spectra indicate a small magnetic noise component that depends on the STT effect that can be suppressed with an applied magnetic field.

Electronic reproduction.
Ann Arbor, Mich. :
ProQuest,
2023

Mode of access: World Wide Web

ISBN: 9781267920515Subjects--Topical Terms:

649834
Electrical engineering.
Subjects--Index Terms:

Magnetic tunnel junctionsIndex Terms--Genre/Form:

542853
Electronic books.

Conductive Atomic Force Microscopy Analysis of Sub-30 nm Magnetic Tunnel Junction Nanopillars.
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