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Failure Analysis of Electronic Connectors Due to In-Service Vibrations.

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Failure Analysis of Electronic Connectors Due to In-Service Vibrations./
作者:	Medshinge, Prasanna.
面頁冊數:	1 online resource (64 pages)
附註:	Source: Masters Abstracts International, Volume: 83-02.
Contained By:	Masters Abstracts International83-02.
標題:	Engineering. -
電子資源:	http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=28714810click for full text (PQDT)
ISBN:	9798538133024

Failure Analysis of Electronic Connectors Due to In-Service Vibrations.
Medshinge, Prasanna.

Failure Analysis of Electronic Connectors Due to In-Service Vibrations. - 1 online resource (64 pages)

Source: Masters Abstracts International, Volume: 83-02.

Thesis (M.E.S.)--Lamar University - Beaumont, 2021.

Includes bibliographical references

Reliability testing of electronic systems creates a significant amount of stress on printed circuit boards (PCBs), mounted chips, and connectors, and that stress will degrade pin quality in mating connectors and cause them to fail prematurely. Being able to quantify pin fretting, which this study aims to do, is essential. More specifically, this study aims to quantify pin fretting as a measure of relative motion within the mating connectors.In this thesis, pin fretting within the mating connectors is studied by considering the dynamics of PCBs, PCBAs and mounting brackets. The assembly consisting of PCBs, mounting brackets and heat sink is modeled as a continuous, lightly damped, multidegrees of freedom system using the Finite Element (FE) based technique. The behavior of the system is studied by exciting the system using the (i) harmonic signal and (ii)random vibration signal.In the harmonic signal vibration study, the excitation frequency is varied around the natural frequencies of the system by keeping the amplitude of excitation constant. The relative motion is quantified in terms of the difference in displacement responses of the mating connectors. The results of the relative motion are in good agreement with the results found in the existing literature.As most of the electronic components are tested using the random vibration signals, it is crucial to quantify the relative motion by using the random vibration signals. A new approach to quantify the relative motion within the mating connector subjected to random vibration excitation is presented. The new approach is based on the utilization of pseudo random time series as an excitation signal. This pseudo random time series is expected to repeat over a period of time and has the same damage content as power spectrum density (PSD).The results of the relative motion of the mating connectors are presented in terms of the maximum amplitude of relative motion and the cumulative relative movement. The significance of the cumulative relative movement is that the complex phenomenon of pin fretting in the mating connectors can be represented by a simple time series model that can be used to correlate the material degradation.

Electronic reproduction.
Ann Arbor, Mich. :
ProQuest,
2023

Mode of access: World Wide Web

ISBN: 9798538133024Subjects--Topical Terms:

586835
Engineering.
Subjects--Index Terms:

Printed circuit boardsIndex Terms--Genre/Form:

542853
Electronic books.

Failure Analysis of Electronic Connectors Due to In-Service Vibrations.
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