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  • Cryogenic Transmission Electron Microscopy for Next-Generation Batteries.
  • Record Type: Electronic resources : Monograph/item
    Title/Author: Cryogenic Transmission Electron Microscopy for Next-Generation Batteries./
    Author: Huang, William.
    Published: Ann Arbor : ProQuest Dissertations & Theses, : 2021,
    Description: 193 p.
    Notes: Source: Dissertations Abstracts International, Volume: 83-02, Section: B.
    Contained By: Dissertations Abstracts International83-02B.
    Subject: Silicon. -
    Online resource: http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=28483338
    ISBN: 9798505572047
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