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Cognitive and emotional influences on event-related brain potentials.

Record Type:	Electronic resources : Monograph/item
Title/Author:	Cognitive and emotional influences on event-related brain potentials./
Author:	Hauser, Monika.
Published:	Ann Arbor : ProQuest Dissertations & Theses, : 2006,
Description:	59 p.
Notes:	Source: Dissertations Abstracts International, Volume: 68-03, Section: B.
Contained By:	Dissertations Abstracts International68-03B.
Subject:	Psychotherapy. -
Online resource:	http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3219009
ISBN:	9780542684098

Cognitive and emotional influences on event-related brain potentials.
Hauser, Monika.

Cognitive and emotional influences on event-related brain potentials. - Ann Arbor : ProQuest Dissertations & Theses, 2006 - 59 p.

Source: Dissertations Abstracts International, Volume: 68-03, Section: B.

Thesis (Ph.D.)--University of Colorado at Boulder, 2006.

This item must not be sold to any third party vendors.

Research using event-related brain potentials (ERPs) has identified an ERP component, the error-related negativity (ERN), which is thought to represent error processing in the brain. Individuals with high negative affect as well as individuals suffering from depression and various anxiety disorders (e.g., OCD and GAD) showed larger ERN amplitudes (Luu et al., 2000; Tucker et al., 2003; Gehring et al., 2000; Hajcak et al., 2002). The primary goal of this study was to enhance our understanding of how this neural mechanism may be associated to cognitive styles such as perfectionism, a risk factor for the development of depression and anxiety (Alloy et al., 1999; Beck, 1976). ERPs for 31 students who have never suffered from a psychological disorder, but who scored high or low on a measure of perfectionism, were calculated by computing response-locked averages of EEGs measured across trials in which subjects made errors during a cognitive reaction-time task (the Flanker task). The results showed that higher levels of perfectionism predicted larger ERNs. The results suggest that the ERN could be viewed as a neural marker for the etiology of depression and anxiety.

ISBN: 9780542684098Subjects--Topical Terms:

519158
Psychotherapy.
Subjects--Index Terms:

Cognitive

Cognitive and emotional influences on event-related brain potentials.
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500 $a Source: Dissertations Abstracts International, Volume: 68-03, Section: B.
500 $a Publisher info.: Dissertation/Thesis.
500 $a Advisor: Craighead, W. Edward.
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506 $a This item must not be added to any third party search indexes.
520 $a Research using event-related brain potentials (ERPs) has identified an ERP component, the error-related negativity (ERN), which is thought to represent error processing in the brain. Individuals with high negative affect as well as individuals suffering from depression and various anxiety disorders (e.g., OCD and GAD) showed larger ERN amplitudes (Luu et al., 2000; Tucker et al., 2003; Gehring et al., 2000; Hajcak et al., 2002). The primary goal of this study was to enhance our understanding of how this neural mechanism may be associated to cognitive styles such as perfectionism, a risk factor for the development of depression and anxiety (Alloy et al., 1999; Beck, 1976). ERPs for 31 students who have never suffered from a psychological disorder, but who scored high or low on a measure of perfectionism, were calculated by computing response-locked averages of EEGs measured across trials in which subjects made errors during a cognitive reaction-time task (the Flanker task). The results showed that higher levels of perfectionism predicted larger ERNs. The results suggest that the ERN could be viewed as a neural marker for the etiology of depression and anxiety.
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