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New Imaging Methods with 4D-STEM: Quantitative Mapping of Fields, Polarity, Tilt, and Phase.

Record Type:	Electronic resources : Monograph/item
Title/Author:	New Imaging Methods with 4D-STEM: Quantitative Mapping of Fields, Polarity, Tilt, and Phase./
Author:	Cao, Michael Chen.
Published:	Ann Arbor : ProQuest Dissertations & Theses, : 2021,
Description:	152 p.
Notes:	Source: Dissertations Abstracts International, Volume: 83-01, Section: B.
Contained By:	Dissertations Abstracts International83-01B.
Subject:	Applied physics. -
Online resource:	http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=28259421
ISBN:	9798516922008

New Imaging Methods with 4D-STEM: Quantitative Mapping of Fields, Polarity, Tilt, and Phase.
Cao, Michael Chen.

New Imaging Methods with 4D-STEM: Quantitative Mapping of Fields, Polarity, Tilt, and Phase. - Ann Arbor : ProQuest Dissertations & Theses, 2021 - 152 p.

Source: Dissertations Abstracts International, Volume: 83-01, Section: B.

Thesis (Ph.D.)--Cornell University, 2021.

This item must not be sold to any third party vendors.

The development of fast pixelated direct electron detectors allows the collection of full scattering information at every scanning point in Scanning Transmission Electron Microscopy (STEM). With two scanning directions (x, y) and two momentum dimensions (kx, ky), this results in a four-dimensional dataset, thus the technique is colloquially referred to as 4D-STEM. 4D diffraction data is not readily interpretable, so it must be processed into a more interpretable two-dimensional image. While traditional imaging modes like high-angle angular dark field and bright field images can be replicated, new methods of processing the diffraction data like Center-of-Mass (COM) imaging can quantitatively measure electric field or other properties of the sample. Thus, a better understanding of what information is stored and where in the diffraction pattern will better inform how we can extract quantitative information from the 4D diffraction dataset. In the first part of this thesis, I go over theoretical calculations for diffraction patterns for a variety of samples. By demonstrating how contrast and movement of the bright disk is affected by sample size compared to probe size, I show how the virtual detector geometry of COM imaging affects what length-scale of electromagnetic field is being measured rather than electric versus magnetic fields. Simulations of multiple scattering demonstrate the signal-to-noise efficiency of second moment imaging for thicker biological samples. Finally, a theoretical calculation of polarity contribution in nanobeam electron diffraction (NBED) from 2D materials makes explicit the origin and Z-dependence of the violation of Friedel's Law even in monolayer samples. In the second part of my thesis, I go over new imaging modes. By understanding how tilt affects placement of diffracted disks in a 2D material, I quantitatively map the in-plane rotation, out-of-plane tilt, and strain in a corrugated sheet of MoS2. Finally, I show how supervised machine learning can be used for high-resolution phase retrieval as a faster, more transferable process than ptychography to demonstrate its capability as a powerful tool for guiding further 4D-STEM characterization development.

ISBN: 9798516922008Subjects--Topical Terms:

3343996
Applied physics.
Subjects--Index Terms:

2D materials

New Imaging Methods with 4D-STEM: Quantitative Mapping of Fields, Polarity, Tilt, and Phase.
LDR:03327nmm a2200349 4500 001 2344766
005 20220531062134.5
008 241004s2021 ||||||||||||||||| ||eng d
020 $a 9798516922008
035 $a (MiAaPQ)AAI28259421
035 $a AAI28259421
040 $a MiAaPQ $c MiAaPQ
100 1 $a Cao, Michael Chen. $0 (orcid)0000-0002-5486-4467 $3 3683572
245 1 0 $a New Imaging Methods with 4D-STEM: Quantitative Mapping of Fields, Polarity, Tilt, and Phase.
260 1 $a Ann Arbor : $b ProQuest Dissertations & Theses, $c 2021
300 $a 152 p.
500 $a Source: Dissertations Abstracts International, Volume: 83-01, Section: B.
500 $a Advisor: Muller, David.
502 $a Thesis (Ph.D.)--Cornell University, 2021.
506 $a This item must not be sold to any third party vendors.
520 $a The development of fast pixelated direct electron detectors allows the collection of full scattering information at every scanning point in Scanning Transmission Electron Microscopy (STEM). With two scanning directions (x, y) and two momentum dimensions (kx, ky), this results in a four-dimensional dataset, thus the technique is colloquially referred to as 4D-STEM. 4D diffraction data is not readily interpretable, so it must be processed into a more interpretable two-dimensional image. While traditional imaging modes like high-angle angular dark field and bright field images can be replicated, new methods of processing the diffraction data like Center-of-Mass (COM) imaging can quantitatively measure electric field or other properties of the sample. Thus, a better understanding of what information is stored and where in the diffraction pattern will better inform how we can extract quantitative information from the 4D diffraction dataset. In the first part of this thesis, I go over theoretical calculations for diffraction patterns for a variety of samples. By demonstrating how contrast and movement of the bright disk is affected by sample size compared to probe size, I show how the virtual detector geometry of COM imaging affects what length-scale of electromagnetic field is being measured rather than electric versus magnetic fields. Simulations of multiple scattering demonstrate the signal-to-noise efficiency of second moment imaging for thicker biological samples. Finally, a theoretical calculation of polarity contribution in nanobeam electron diffraction (NBED) from 2D materials makes explicit the origin and Z-dependence of the violation of Friedel's Law even in monolayer samples. In the second part of my thesis, I go over new imaging modes. By understanding how tilt affects placement of diffracted disks in a 2D material, I quantitatively map the in-plane rotation, out-of-plane tilt, and strain in a corrugated sheet of MoS2. Finally, I show how supervised machine learning can be used for high-resolution phase retrieval as a faster, more transferable process than ptychography to demonstrate its capability as a powerful tool for guiding further 4D-STEM characterization development.
590 $a School code: 0058.
650 4 $a Applied physics. $3 3343996
650 4 $a Materials science. $3 543314
653 $a 2D materials
653 $a 4D-STEM
653 $a Electron microscopy
653 $a Machine learning
690 $a 0215
690 $a 0794
710 2 $a Cornell University. $b Applied Physics. $3 3192645
773 0 $t Dissertations Abstracts International $g 83-01B.
790 $a 0058
791 $a Ph.D.
792 $a 2021
793 $a English
856 4 0 $u http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=28259421